| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Hughes, Greg
Dublin City University
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (13/13 displayed)
- 2022Growth chemistry of cobalt nitride by plasma enhanced atomic layer depositioncitations
- 2021Analysing trimethylaluminum infiltration intopolymer brushes using a scalable area selectivevapor phase processcitations
- 2020A new method for assessing the utility of powder bed fusion (PBF) feedstock through lifecitations
- 2020Precise definition of a ‘monolayer point’ in polymer brush films for fabricating highly coherent TiO2 thin films by vapor phase Infiltrationcitations
- 2020A new method for assessing the recyclability of powders within Powder Bed Fusion processcitations
- 2019Surface characterization of poly-2-vinylpyridine-A polymer for area selective deposition techniquescitations
- 2019Surface characterization of Poly 2-Vinylpyridine - a polymer for area selective deposition techniquescitations
- 2016Chemical and electrical characterisation of the segregation of Al from a CuAl alloy (90%:10% wt) with thermal annealcitations
- 2016A photoemission study of the effectiveness of nickel, manganese, and cobalt based corrosion barriers for silicon photo-anodes during water oxidationcitations
- 2014High temperature thermal stability of the HfO2/Ge (100) interface as a function of surface preparation studied by synchrotron radiation core level photo emissioncitations
- 2014High-temperature stability study of 1 nm Al2O3 deposited on InAs surfaces investigated by synchrotron radiation based photoemission spectroscopycitations
- 2009Electronic structure of the organic semiconductor copper tetraphenylporphyrin (CuTPP)citations
- 2008Electrical, structural, and chemical properties of HfO₂ films formed by electron beam evaporationcitations
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article
Electronic structure of the organic semiconductor copper tetraphenylporphyrin (CuTPP)
Abstract
<p>The electronic structure of thin films of the organic semiconductor copper tetraphenylporphyrin (CuTPP) has been studied using synchrotron radiation-excited resonant soft X-ray emission spectroscopy (RSXE), near edge X-ray absorption fine structure (NEXAFS) spectroscopy, and X-ray photoemission spectroscopy (XPS). The C and N partial density of states for both the valence and conduction band electronic structure has been determined, while XPS was used to provide information on the chemical composition and the oxidation states of the copper. Good agreement was found between the experimental measurements of the valence and conduction bands and the results of density functional theory calculations.</p>