Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (5/5 displayed)

  • 2016XPS valence band studies of nanocrystalline Zr[sbnd]Pd alloy thin films15citations
  • 2015Chemical etching of stainless steel 301 for improving performance of electrochemical capacitors in aqueous electrolyte21citations
  • 2015Ba termination of Ge(001) studied with STMcitations
  • 2015Initial growth of Ba on Ge(001): An STM and DFT studycitations
  • 2008STM study of titanium silicide nanostructure growth on Si(1 1 1)-(sqrt(19) × sqrt(19)) substrate10citations

Places of action

Chart of shared publication
Wachowiak, M.
1 / 2 shared
Rogowska, A.
1 / 1 shared
Smardz, L.
1 / 3 shared
Majchrzycki, Łukasz
1 / 8 shared
Werwiński, M.
1 / 1 shared
Redlińska-Marczyńska, Aleksandra Elżbieta
1 / 3 shared
Pacanowski, S.
1 / 3 shared
Skoryna, J.
1 / 1 shared
Grzeszkowiak, Mikołaj Marcel
1 / 1 shared
Nowicki, Marek
1 / 16 shared
Béguin, F.
1 / 3 shared
Jezowski, P.
1 / 1 shared
Capellini, G.
1 / 13 shared
Radny, Mw
2 / 2 shared
Schroeder, T.
1 / 21 shared
Grzela, T.
2 / 2 shared
Schofield, Sr
2 / 3 shared
Koczorowski, W.
2 / 2 shared
Curson, Nj
2 / 5 shared
Jurczyszyn, L.
1 / 1 shared
Puchalska, A.
1 / 1 shared
Bazarnik, M.
1 / 1 shared
Bos-Liedke, Agnieszka
1 / 1 shared
Biskupski, Piotr
1 / 2 shared
Winiarz, S.
1 / 1 shared
Wawro, A.
1 / 3 shared
Gutek, J.
1 / 1 shared
Suto, S.
1 / 2 shared
Mielcarek, Sławomir
1 / 8 shared
Cegiel, M.
1 / 1 shared
Chart of publication period
2016
2015
2008

Co-Authors (by relevance)

  • Wachowiak, M.
  • Rogowska, A.
  • Smardz, L.
  • Majchrzycki, Łukasz
  • Werwiński, M.
  • Redlińska-Marczyńska, Aleksandra Elżbieta
  • Pacanowski, S.
  • Skoryna, J.
  • Grzeszkowiak, Mikołaj Marcel
  • Nowicki, Marek
  • Béguin, F.
  • Jezowski, P.
  • Capellini, G.
  • Radny, Mw
  • Schroeder, T.
  • Grzela, T.
  • Schofield, Sr
  • Koczorowski, W.
  • Curson, Nj
  • Jurczyszyn, L.
  • Puchalska, A.
  • Bazarnik, M.
  • Bos-Liedke, Agnieszka
  • Biskupski, Piotr
  • Winiarz, S.
  • Wawro, A.
  • Gutek, J.
  • Suto, S.
  • Mielcarek, Sławomir
  • Cegiel, M.
OrganizationsLocationPeople

article

STM study of titanium silicide nanostructure growth on Si(1 1 1)-(sqrt(19) × sqrt(19)) substrate

  • Bazarnik, M.
  • Bos-Liedke, Agnieszka
  • Biskupski, Piotr
  • Czajka, R.
  • Winiarz, S.
  • Wawro, A.
  • Gutek, J.
  • Suto, S.
  • Mielcarek, Sławomir
  • Cegiel, M.
Abstract

<p>We have performed an STM/STS study of titanium silicide nanostructures grown on Si(1 1 1)-(sqrt(19) × sqrt(19)) substrate by Ti evaporation and post-deposition annealing. The (sqrt(19) × sqrt(19)) reconstruction was induced by Ni doping. The reaction between the deposited material and the substrate at 220 K was radically different from that observed in the case of the standard Si(1 1 1)-(7 × 7) substrate, as evidenced by the different evaporation time necessary to obtain a comparable coverage of the surface. The annealing was accomplished by direct heating of a crystal sample (up to 520 K, 670 K and 970 K). Measurements showed that coalescence of Ti nanoislands began between 520 K and 670 K. Annealing above 900 K led to alloying of Ti, Ni and Si. As a consequence, Si(1 1 1)-(7 × 7) reconstruction occurred at the cost of Si(1 1 1)-(sqrt(19) × sqrt(19)). © 2008 Elsevier B.V. All rights reserved.</p>

Topics
  • Deposition
  • surface
  • titanium
  • annealing
  • evaporation
  • scanning tunneling microscopy
  • silicide
  • scanning tunnelling spectroscopy