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| Naji, M. |
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| Azevedo, Nuno Monteiro |
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Yang, X. N.
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Topics
Publications (10/10 displayed)
- 2005Tetrahedral n-type materials: efficient quenching of the excitation of p-type polymers in amorphous filmscitations
- 2005Nanoscale morphology of high-performance polymer solar cellscitations
- 2005Nanoscale fibrillar crystals of PET from dilute quiescent solutioncitations
- 2004Characterization of poly(p-phenylene vinylene)/methanofullerene blends of polymer solar cells by time-of-flight secondary ion mass spectrometrycitations
- 2004Characterization of poly(p-phenylene vinylene)/methanofullerene blends of polymer solar cells by time-of-flight secondary ion mass spectrometrycitations
- 2004Photovoltaic properties of a conjugated polymer blend of MDMO-PPV and PCNEPV.citations
- 2004Relating the morphology of poly(p-phenylene vinylene)/methanofullerene blend to bulk heterojunction solar cell performancecitations
- 2004Relating the morphology of poly(p-phenylene vinylene)/methanofullerene blend to bulk heterojunction solar cell performancecitations
- 2004Relating the morphology of poly(p-phenylene vinylene)/methanofullerene blends to solar-cell performancecitations
- 2004Relating the morphology of poly(p-phenylene vinylene)/methanofullerene blends to solar-cell performancecitations
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article
Characterization of poly(p-phenylene vinylene)/methanofullerene blends of polymer solar cells by time-of-flight secondary ion mass spectrometry
Abstract
The performance of bulk heterojunction solar cells (BHSC) strongly depends on the mol. morphol. of the .apprx.100 nm thick spin cast photoactive films of the polymer/fullerene composites used. Using dynamic TOF-SIMS, we show here that spontaneous stratification is absent for several methanofullerene concns. by use of a deuterium labeled methanofullerene in composite films of a poly(p-phenylene vinylene) and a methanofullerene. In addn., imaging TOF-SIMS on annealed samples shows a dramatic increase in phase segregation on a sub-micron level. The TOF-SIMS results are supported by transmission electron microscopy (TEM) and at. force microscopy (AFM) measurements