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Van, J. K. J. Duren
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Topics
Publications (10/10 displayed)
- 2005Compositional dependence of the performance of poly(p-phylene vinylene): methanofullerene bulk-heterojunction solar cellscitations
- 2004Characterization of poly(p-phenylene vinylene)/methanofullerene blends of polymer solar cells by time-of-flight secondary ion mass spectrometrycitations
- 2004Relating the morphology of poly(p-phenylene vinylene)/methanofullerene blend to bulk heterojunction solar cell performancecitations
- 2004Morphology and thermal stability of the active layer in poly(p-phenylenevinylene)/methanofullerene plastic photovoltaic devicescitations
- 2004Relating the morphology of poly(p-phenylene vinylene)/methanofullerene blends to solar-cell performancecitations
- 2003Characterization of polymer solar cells by TOF-SIMS depth profilingcitations
- 2003Thermally induced transient absorption of light by poly(3,4-ethylenedioxythiophene):Poly(styrene sulfonic acid) (PEDOT:PSS) films: A way to probe charge-carrier thermalization processescitations
- 2002Simulation of electrical conductivity in a pi-conjugated polymeric conductor with infrared lightcitations
- 2002The use of the focused ion beam technique to prepare cross-sectional transmission electron microscopy specimen of polymer solar cells deposited on glasscitations
- 2002In-situ compositional and structural analysis of plastic solar cells
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article
Characterization of poly(p-phenylene vinylene)/methanofullerene blends of polymer solar cells by time-of-flight secondary ion mass spectrometry
Abstract
The performance of bulk heterojunction solar cells (BHSC) strongly depends on the mol. morphol. of the .apprx.100 nm thick spin cast photoactive films of the polymer/fullerene composites used. Using dynamic TOF-SIMS, we show here that spontaneous stratification is absent for several methanofullerene concns. by use of a deuterium labeled methanofullerene in composite films of a poly(p-phenylene vinylene) and a methanofullerene. In addn., imaging TOF-SIMS on annealed samples shows a dramatic increase in phase segregation on a sub-micron level. The TOF-SIMS results are supported by transmission electron microscopy (TEM) and at. force microscopy (AFM) measurements