• Grumsen, Flemming Bjerg
• Zelenika, A.
• Yildirim, C.
• Detlefs, C.
• Poulsen, Henning, F.
• Winther, Grethe
• Rodriguez-Lamas, R.

Abstract

Dislocation patterning and self-organization during plastic deformation are associated with work hardening, but the exact mechanisms remain elusive. This is partly because studies of the structure and local strain during the initial stages of plastic deformation are a challenge. For this reason, literature data typically cover strains from 0.05-0.1 and higher. Here we use Dark Field X-ray Microscopy to generate 3D maps of embedded350 x 900 x 72 µm³ volumes within three pure Al single crystals. Tensile deformation was applied to true strains of 0.6%, 1.7%, and 3.5% along the [10 13 −10] direction. Orientation maps revealed the existence of two distinct types of planar dislocation boundaries both at 0.6% and 1.7% but no systematic patterning. At 3.5%, these boundaries have evolved into a well-defined checkerboard pattern, characteristic of Geometrically Necessary Boundaries, GNBs. The crystallographic alignment of the GNBs match that in polycrystals for grains of similar orientation. The GNB spacing measured perpendicular to the planesis≈6 µmand the misorientation ≈ 0.2° in fair agreement with literature data for higher strains. By contrast to the sharp boundaries observed at higher strains, the boundaries are associated with a sinusoidal orientation gradient, showing that they are not yet fully formed. Maps of the elastic strain along the (111) direction exhibit strain variations ±0.0002 ofwith an average domain size of 3 µm<br/>

Topics

• impedance spectroscopy
• polymer
• single crystal
• grain
• dislocation
• microscopy
• orientation map