Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Université de Caen Normandie

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2022Stress relaxation in III-V nitrides: investigation of metallic atoms interaction with the N-vacancy1citations
  • 2019Misorientation dependence grain boundary complexions in <111> symmetric tilt Al grain boundaries13citations
  • 2018A Theoretical Investigation of the Miscibility and Structural Properties of In x Al y Ga 1−x−y N Alloys9citations
  • 2014Influence of Morphological Texture on Stresses Analysis by X-Ray and Neutron Diffraction: Accounting for Extreme Morphologiescitations

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Ruterana, Pierre
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Ramdani, Rofka
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Chen, Jun
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Romeu, David
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Yacamán, Miguel José
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Mendoza-Cruz, Rubén
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Parajuli, Prakash
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Flowers, Jacob
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Co-Authors (by relevance)

  • Ruterana, Pierre
  • Ramdani, Rofka
  • Chen, Jun
  • Romeu, David
  • Yacamán, Miguel José
  • Mendoza-Cruz, Rubén
  • Parajuli, Prakash
  • Flowers, Jacob
  • Ponce, Arturo
  • Béré, Antoine
  • Gamarra, Piero
  • Mohamad, Ranim
  • Gloaguen, David
  • Fréour, Sylvain
  • Legrand, Vincent
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article

Misorientation dependence grain boundary complexions in <111> symmetric tilt Al grain boundaries

  • Romeu, David
  • Yacamán, Miguel José
  • Mendoza-Cruz, Rubén
  • Parajuli, Prakash
  • Hounkpati, Viwanou
  • Flowers, Jacob
  • Ponce, Arturo
  • Chen, Jun
Abstract

Since polycrystalline alloys consist of a complex network of various types of grain boundaries (GBs), detailed atomic-scale analysis of how some impurities are distributed at every type of GBs is necessary to fully understand the implications of GB segregation on material's performance. In this study, we present the atomic-scale structural combined with a chemical analysis of segregation induced GB complexions across the various types of Al alloy 7075 GBs using aberration-corrected microscopy and crystal orientation mapping assisted with precession electron diffraction. The result shows multilayer Cu GB segregation containing non-uniformly segregated mixed atomic columns across the interfaces. Two distinct types of Cu GB segregation behavior were observed, point and parallel array, analyzed by means of a displacement field obtained from the dichromatic pattern. Atomistic simulations were performed to test the energetic feasibility of the observed segregation behavior. As per the knowledge of the authors, this is the first report on experimental analysis of segregation induced periodic ordered structured GB complexions on Al alloy system. Furthermore, every GBs of the films were segregated uniquely forming ordered structures along the interface. The distance between two consecutive high segregated units was periodic for the point segregated GBs and followed a trend of a theoretical model of dislocation spacing. Based on the distance between two high segregated units, it is inferred that highly misorientated GBs are more segregated than low misoriented GBs. This study demonstrates that the misorientation between the neighboring grains significantly influences the segregation behavior across the interface and consequently, the structure of segregation-induced GB complexions.

Topics
  • impedance spectroscopy
  • grain
  • grain boundary
  • thin film
  • simulation
  • electron diffraction
  • transmission electron microscopy
  • dislocation
  • forming
  • microscopy