Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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693.932 PEOPLE
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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (8/8 displayed)

  • 2021Ion irradiation-induced localized stress relaxation in W thin film revealed by cross-sectional X-ray nanodiffraction3citations
  • 2020Indentation-Induced Structural Changes in Vitreous Silica Probed by in-situ Small-Angle X-Ray Scattering7citations
  • 2019Strain and stress analyses on thermally annealed Ti-Al-N/Mo-Si-B multilayer coatings by synchrotron X-ray diffraction10citations
  • 2016Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film36citations
  • 2016Cross-sectional structure-property relationship in a graded nanocrystalline Ti1−xAlxN thin film36citations
  • 2016Cross-sectional structure-property relationship in a graded nanocrystalline $mathrm{Ti_{1−x}Al_{x}N}$ thin film36citations
  • 2016Mapping strain fields induced in Zr-based bulk metallic glasses during in-situ nanoindentation by X-ray nanodiffraction13citations
  • 2007Erratum: The small-angle and wide-angle X-ray scattering set-up at beamline BL9 of DELTA (Journal of Synchrotron Radiation (2007) 14 (244-251))5citations

Places of action

Chart of shared publication
Zalesak, Jaroslav
1 / 1 shared
Mackova, A.
1 / 13 shared
Keckes, J.
3 / 48 shared
Burghammer, M.
1 / 37 shared
Davydok, A.
2 / 6 shared
Daniel, Rostislav
2 / 18 shared
Todt, Juraj
1 / 24 shared
Hlushko, K.
1 / 4 shared
Limbach, R.
1 / 5 shared
Bruns, S.
1 / 7 shared
De Macedo, G. N. B. M.
1 / 1 shared
Fuhrmann, Sindy
1 / 15 shared
Durst, K.
1 / 74 shared
Wondraczek, L.
1 / 41 shared
Aschauer, Elias
1 / 1 shared
Polcik, P.
1 / 16 shared
Arndt, M.
1 / 5 shared
Riedl, H.
1 / 18 shared
Mayrhofer, P. H.
4 / 24 shared
Bolvardi, H.
1 / 2 shared
Bartosik, M.
4 / 6 shared
Keckes, Julius
1 / 4 shared
Mitterer, Christian
1 / 28 shared
Kiener, Daniel
1 / 39 shared
Zalesak, J.
3 / 5 shared
Mitterer, C.
2 / 20 shared
Daniel, R.
2 / 7 shared
Kiener, D.
2 / 12 shared
Breguet, J. M.
1 / 1 shared
Gamcová, J.
1 / 2 shared
Michler, J.
1 / 94 shared
Bednarčík, J.
1 / 14 shared
Wehrs, J.
1 / 11 shared
Mohanty, G.
1 / 9 shared
Franz, H.
1 / 27 shared
Michalik, Š.
1 / 5 shared
Tolan, M.
1 / 7 shared
Raabe, Dierk
1 / 523 shared
Winter, R.
1 / 2 shared
Al-Sawalmih, A.
1 / 6 shared
Paulus, M.
1 / 6 shared
Yi, S.
1 / 65 shared
Sternemann, C.
1 / 6 shared
Javid, N.
1 / 1 shared
Chart of publication period
2021
2020
2019
2016
2007

Co-Authors (by relevance)

  • Zalesak, Jaroslav
  • Mackova, A.
  • Keckes, J.
  • Burghammer, M.
  • Davydok, A.
  • Daniel, Rostislav
  • Todt, Juraj
  • Hlushko, K.
  • Limbach, R.
  • Bruns, S.
  • De Macedo, G. N. B. M.
  • Fuhrmann, Sindy
  • Durst, K.
  • Wondraczek, L.
  • Aschauer, Elias
  • Polcik, P.
  • Arndt, M.
  • Riedl, H.
  • Mayrhofer, P. H.
  • Bolvardi, H.
  • Bartosik, M.
  • Keckes, Julius
  • Mitterer, Christian
  • Kiener, Daniel
  • Zalesak, J.
  • Mitterer, C.
  • Daniel, R.
  • Kiener, D.
  • Breguet, J. M.
  • Gamcová, J.
  • Michler, J.
  • Bednarčík, J.
  • Wehrs, J.
  • Mohanty, G.
  • Franz, H.
  • Michalik, Š.
  • Tolan, M.
  • Raabe, Dierk
  • Winter, R.
  • Al-Sawalmih, A.
  • Paulus, M.
  • Yi, S.
  • Sternemann, C.
  • Javid, N.
OrganizationsLocationPeople

article

Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film

  • Keckes, Julius
  • Mayrhofer, P. H.
  • Mitterer, Christian
  • Kiener, Daniel
  • Krywka, C.
  • Daniel, Rostislav
  • Zalesak, J.
  • Bartosik, M.
Abstract

<p>The influence of simultaneously occurring gradients of crystalline phases, microstructure, chemical composition and strains on overall as well as local mechanical properties of nanocrystalline thin films is challenging to understand. In this work, cross-sectional structure-property relationships in a graded nanocrystalline 2 μm thick Ti<sub>1-x</sub>Al<sub>x</sub>N film were analyzed using in-situ bending tests on micro-cantilevers in transmission electron microscope, synchrotron X-ray nanodiffraction and nanoindentation. The results document that sub-micron depth variations of fracture stresses, hardness and elastic moduli depend on phases, crystallite sizes, crystallographic texture, Ti/Al ratio and residual strain. The local mechanical properties are primarily influenced by cross-sectional occurrence of binary and ternary phases and their intrinsic properties. Secondly, the hardness and fracture stress gradients depend on cross-sectional microstructure, especially on the local crystallite sizes and shapes as well as fiber textures. Two nucleation regions of cubic TiN and hexagonal Ti<sub>1-x</sub>Al<sub>x</sub>N phases with globular shaped crystal sizes in the nm range and relatively large in-plane residuals strains result in significantly higher hardness and fracture stresses in comparison with a coarse-grained region consisting of columnar cubic Ti<sub>1-x</sub>Al<sub>x</sub>N crystallites. The fracture behavior of cantilevers with ∼0.5 × 0.5 μm<sup>2</sup> cross-section depends also on the apparent grain size whereby the nucleation regions exhibit linear-elastic fracture in contrast to partly ductile response of the region with elongated nanocrystals. Finally, the experimental data indicate the possibility of mechanical optimization of nanocrystalline thin films through cross-sectional nanoscale design.</p>

Topics
  • impedance spectroscopy
  • grain
  • grain size
  • thin film
  • crystalline phase
  • hardness
  • nanoindentation
  • chemical composition
  • bending flexural test
  • texture
  • fracture behavior
  • tin