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| Naji, M. |
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| Motta, Antonella |
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| Mohamed, Tarek |
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| Petrov, R. H. | Madrid |
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| Ali, M. A. |
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| Rančić, M. |
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| Azevedo, Nuno Monteiro |
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Stevens, Oliver A. C.
University of Bristol
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article
The role of beam dispersion in Raman and photo-stimulated luminescence piezo-spectroscopy of yttria-stabilized zirconia in multi-layered coatings
Abstract
Laser beam dispersion affects the resolution of Raman andphoto-stimulated luminescence piezo-spectroscopy measurements oftransparent materials. In this paper, we investigate the lateralspreading of the laser beam and the axial sampling depth of Ramanspectroscopy measurements within thermal sprayed yttria-stabilizedzirconia (YSZ) thin coatings. The lateral diameters of the laser beams(λ = 632.8 nm and 514 nm) reach approximately ∼160 μm after travellingthrough a thickness of 200 μm of air plasma sprayed (APS) YSZ and ∼80 μmafter travelling through 120 μm of electron beam physical vapourdeposited YSZ. The Raman spectroscopy sampling depth was found to bebetween 30 and 40 μm in APS YSZ. The beam dispersions within these twocoatings were simulated using the ray-tracing software ZEMAX tounderstand the observed scattering patterns. The results are discussedwith respect to the application of these two spectroscopic techniques inmulti-layered thermal barrier coating systems.