• Ernst, Wolfgang E.
• Hohenau, Andreas
• Jauk, Thomas
• Krenn, Joachim R.
• Ditlbacher, Harald
• Lackner, Florian

Abstract

<jats:title>Abstract</jats:title><jats:p>We image surface plasmons on aluminum surfaces in the ultraviolet and blue spectral range with photoemission electron microscopy (PEEM). Plasmon excitation is mediated by light incident on straight aluminum ridges with subwavelength cross section on flat aluminum films. We observe interference patterns due to light/plasmon interaction, with distinct periodicity and orientation depending on the light in-plane incidence angle with respect to the ridge orientation. From the interference patterns, we deduce the surface plasmon propagation directions and decay lengths. The latter are remarkably high with 2.8 <jats:inline-formula><jats:alternatives><jats:tex-math></jats:tex-math><mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mi>μ</mml:mi></mml:math></jats:alternatives></jats:inline-formula>m and 8.4 <jats:inline-formula><jats:alternatives><jats:tex-math></jats:tex-math><mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mi>μ</mml:mi></mml:math></jats:alternatives></jats:inline-formula>m for excitation wavelengths of 273 nm and 410 nm, respectively. Our results extend PEEM imaging of surface plasmons into the ultraviolet region.</jats:p>

Topics

• impedance spectroscopy
• surface
• aluminium
• electron microscopy