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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Jacob, Mohan V.
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Topics
Publications (15/15 displayed)
- 2023Antimicrobial graphene-based coatings for biomedical implant applicationscitations
- 2022Plasma polymers from oregano secondary metabolitescitations
- 2022Bactericidal vertically aligned graphene networks derived from renewable precursorcitations
- 2015Electrical conduction in plasma polymerized thin films of γ-terpinenecitations
- 2012Microwave properties of Yttrium Vanadate at cryogenic temperatures
- 2011The Effect of Polyterpenol Thin Film Surfaces on Bacterial Viability and Adhesioncitations
- 2008Mesurements of thin resistive films employing split post dielectric resonator technique
- 2006Temperature dependence of complex permittivity of planar microwave materialscitations
- 2005Dielectric Properties of Yttrium Vanadate Crystals from 15 K to 295 Kcitations
- 2005Precise microwave characterisation of low loss dielectrics
- 2004A cryogenic post dielectric resonator for precise microwave characterization of planar dielectric materials for superconducting circuitscitations
- 2004Complex permittivity measurements at variable temperatures of low loss dielectric substrates employing split post and single post dielectric resonatorscitations
- 2004Precise microwave characterization of MgO substrates for HTS circuits with superconducting post dielectric resonatorcitations
- 2003Measurements of loss tangent and relative permittivity of LTCC ceramics at varying temperatures and frequenciescitations
- 2003Microwave Properties of Yttrium Vanadate Crystals at Cryogenic Temperatures
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article
Dielectric Properties of Yttrium Vanadate Crystals from 15 K to 295 K
Abstract
Yttrium Vanadate (YVO4) is a birefringent crystal, which has similar dielectric constant as that of Sapphire. In this paper we have reported the measurement of the real part of permittivity and loss tangent of YVO4 crystal in the temperature range 15–295 K at a frequency of 16.3 GHz. We have used the dielectric post resonator technique for the microwave characterisation of the YVO4 dielectric rod. The multifrequency Transmission Mode Q-Factor (TMQF) technique has been used for data processing and hence precise values of permittivity and loss tangent are achieved. Easily machineable YVO4 is characterized by low losses at microwave frequencies. At temperature of 15 K and frequency of 16.3 GHz the permittivity was 9.23 and loss tangent was 2 × 10− 5. YVO4 is identified as a potential candidate to replace expensive Sapphire in many microwave applications.