| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Poulsen, Henning, F.
Technical University of Denmark
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (28/28 displayed)
- 20243D microstructural and strain evolution during the early stages of tensile deformationcitations
- 2024Microstructure and stress mapping in 3D at industrially relevant degrees of plastic deformationcitations
- 2023Exploring 4D microstructural evolution in a heavily deformed ferritic alloycitations
- 2023Inferring the probability distribution over strain tensors in polycrystals from diffraction based measurementscitations
- 2022High-resolution 3D X-ray diffraction microscopy: 3D mapping of deformed metal microstructurescitations
- 2022Multiscale Exploration of Texture and Microstructure Development in Recrystallization Annealing of Heavily Deformed Ferritic Alloyscitations
- 2022Multiscale characterisation of strains in semicrystalline polymers
- 20224D microstructural evolution in a heavily deformed ferritic alloycitations
- 2020Grain boundary mobilities in polycrystalscitations
- 2019Fast and quantitative 2D and 3D orientation mapping using Raman microscopycitations
- 2018Three-dimensional grain growth in pure iron. Part I. statistics on the grain levelcitations
- 2017Determining material parameters using phase-field simulations and experimentscitations
- 2017Ultra-low-angle boundary networks within recrystallizing grainscitations
- 2015Injection molded polymeric hard X-ray lensescitations
- 2014High-Resolution Reciprocal Space Mapping for Characterizing Deformation Structurescitations
- 2012X-ray diffraction contrast tomography (DCT) system, and an X-ray diffraction contrast tomography (DCT) method
- 2011On the Use of Laguerre Tessellations for Representations of 3D Grain Structurescitations
- 2011Grain-resolved elastic strains in deformed copper measured by three-dimensional X-ray diffractioncitations
- 2011Three-Dimensional Orientation Mapping in the Transmission Electron Microscopecitations
- 2009Structured scintillators for X-ray imaging with micrometre resolutioncitations
- 2009New opportunities for 3D materials science of polycrystalline materials at the micrometre lengthscale by combined use of X-ray diffraction and X-ray imagingcitations
- 2009Measuring the elastic strain of individual grains in polycrystalline materials
- 2008A high-spatial-resolution three-dimensional detector array for 30-200 keV X-rays based on structured scintillatorscitations
- 2004Simultaneous measurement of the strain tensor of 10 individual grains embedded in an Al tensile samplecitations
- 2004Measurement of the components of plastic displacement gradients in three dimensionscitations
- 2004Metal Microstructures in Four Dimensions
- 20023DXRD microscopy - a comparison with neutron diffractioncitations
- 2000A high energy microscope for local strain measurements within bulk materials
Places of action
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article
3DXRD microscopy - a comparison with neutron diffraction
Abstract
3DXRD microscopy is a novel tool for fast and non-destructive characterisation of the individual grains and sub-grains inside bulk materials (powders or polycrystals). The method is based on diffraction with hard X-rays (E > 50 keV), enabling 3D studies of millimeter to centimeter-thick specimens. The position, volume, orientation, and elastic strain can be determined in hundreds of grains simultaneously. Furthermore, the evolution of the plastic strain can be characterised from grain rotations. Likewise, for coarse-grained materials, the topography of the grain boundaries can be mapped. The status of the technique is presented and the potential for in situ processing studies illustrated. The hard-X-ray method is compared to conventional neutron-diffraction techniques: texture and strain measurements, small-angle scattering, and in situ powder diffraction.