Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2023A virtual stylus method for non-destructive roughness profile measurement of additive manufactured lattice structures3citations
  • 2022A Comparison of Statistically Equivalent and Realistic Microstructural Representative Volume Elements for Crystal Plasticity Models15citations

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Chart of shared publication
Downing, David
1 / 2 shared
Elambasseril, Joe
1 / 4 shared
Qian, Ma
1 / 6 shared
Rogers, Jason
1 / 2 shared
Tino, Rance
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Leary, Martin
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Brandt, Milan
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Sterjovski, Zoran
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Agius, Dylan
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Davids, William
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Chen, Hansheng
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Ringer, Simon P.
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Wang, Chun H.
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Schaffer, Graham
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Crawford, Bruce R.
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2023
2022

Co-Authors (by relevance)

  • Downing, David
  • Elambasseril, Joe
  • Qian, Ma
  • Rogers, Jason
  • Tino, Rance
  • Leary, Martin
  • Brandt, Milan
  • Sterjovski, Zoran
  • Agius, Dylan
  • Davids, William
  • Chen, Hansheng
  • Ringer, Simon P.
  • Wang, Chun H.
  • Schaffer, Graham
  • Crawford, Bruce R.
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article

A virtual stylus method for non-destructive roughness profile measurement of additive manufactured lattice structures

  • Downing, David
  • Wallbrink, Chris
  • Elambasseril, Joe
  • Qian, Ma
  • Rogers, Jason
  • Tino, Rance
  • Leary, Martin
  • Brandt, Milan
Abstract

<jats:title>Abstract </jats:title><jats:p>Surface roughness is traditionally evaluated with contact profilometry; however, these methods are not compatible with complex additive manufactured lattice structures due to limited physical access. For these scenarios, computed tomography (CT) is often used to provide qualitative insight into surface roughness but does not directly yield roughness profile data. This research describes a hybrid approach for the non-destructive quantification of roughness profile data for lattice structures based on the mathematical reconstruction and interpretation of CT data. Formal analyses are applied to propose the theoretical minimum CT voxel size required to characterise surface roughness for a specified sampling length. The method is verified against optical data for nominally flat metallic specimens and applied to metallic and polymeric cylinders fabricated by powder bed fusion and material extrusion respectively. This research also assesses the influence of CT reconstruction thresholding as a process variable and finds that roughness profile data is only weakly influenced by thresholding settings, due to scattering effects at the surface — a novel finding that provides certainty for the industrial application of this method. The ability of the proposed method to accurately characterise the inherent surface roughness of these processes as well as the effect of specimen orientation is thus demonstrated, enabling full geometric characterisation supporting subsequent certification analysis. The method can be algorithmically implemented in combination with the generative design of complex lattice structures to support structural certification requirements.</jats:p>

Topics
  • impedance spectroscopy
  • surface
  • extrusion
  • tomography
  • material extrusion
  • powder bed fusion
  • profilometry