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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Jeynes, C.
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Topics
Publications (9/9 displayed)
- 2015Modifying polyester surfaces with incompatible polymer additivescitations
- 2013Integrated Ion Beam Analysis (IBA) in Gunshot Residue (GSR) characterisationcitations
- 2013High dose ion irradiation effects on immiscible AlN/TiN nano-scaled multilayerscitations
- 2012Carrier Control in Polycrystalline ZnO:Ga Thin Films via Nitrogen Implantation Electronic Materials and Processingcitations
- 2009Trace element profiling of gunshot residues by PIXE and SEM-EDScitations
- 2008RBS/EBS/PIXE measurement of single-walled carbon nanotube modification by nitric acid purification treatmentcitations
- 2008Interactions of photoresist stripping plasmas with nanoporous organo-silicate ultra low dielectric constant dielectricscitations
- 2005Evaluation of BBr2 + and B+ + Br + implants in silicon
- 2005Comparison of elemental boron and boron halide implants into siliconcitations
Places of action
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article
Trace element profiling of gunshot residues by PIXE and SEM-EDS
Abstract
<p>A feasibility study was carried out into the use of particle-induced x-ray emission (PIXE) on the ion microprobe for the characterisation of gunshot residues (GSR). We compare these results with the conventional technique, scanning electron microscopy with energy dispersive x-ray spectroscopy (SEM-EDS). Samples of gunshot residue from four different sources were collected. Individual particles of GSR were analysed by SEM-EDS using a 30-keV electron beam focussed to ~10 nm, and PIXE using a 2.5-MeV proton beam focussed to ~4 μm. PIXE revealed trace or minor elements undetectable by SEM-EDS, thereby strengthening the discrimination between different types of GSR.</p>