Materials Map

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2019No Evidence for Passivation Effects of Na and K at Grain Boundaries in Polycrystalline Cu(In,Ga)Se<sub>2</sub> Thin Films for Solar Cells21citations

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Guthrey, Harvey
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Dávila, Sebastián Caicedo
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2019

Co-Authors (by relevance)

  • Guthrey, Harvey
  • Dávila, Sebastián Caicedo
  • Nikolaeva, Aleksandra
  • Scheer, Roland
  • Al-Jassim, Mowafak
  • Abou-Ras, Daniel
  • Krause, Maximilian
OrganizationsLocationPeople

article

No Evidence for Passivation Effects of Na and K at Grain Boundaries in Polycrystalline Cu(In,Ga)Se<sub>2</sub> Thin Films for Solar Cells

  • Guthrey, Harvey
  • Dávila, Sebastián Caicedo
  • Nikolaeva, Aleksandra
  • Scheer, Roland
  • Morawski, Marcin
  • Al-Jassim, Mowafak
  • Abou-Ras, Daniel
  • Krause, Maximilian
Abstract

<jats:sec><jats:label /><jats:p>Thin‐film solar cells based on Cu(In,Ga)Se<jats:sub>2</jats:sub> (CIGSe) absorber layers reach conversion efficiencies of above 20%. One key to this success is the incorporation of alkali metals, such as Na and K, into the surface and the volume of the CIGSe thin film. The present work discusses the impact of Na and K on the grain‐boundary (GB) properties in CIGSe thin films, i.e., on the barriers for charge carriers, Φ<jats:sub>b</jats:sub>, and on the recombination velocities at the GBs, <jats:italic>s</jats:italic><jats:sub>GB</jats:sub>. First, the physics connected with these two quantities as well as their impact on the device performance are revised, and then the values for the barrier heights and recombination velocities are provided from the literature. The <jats:italic>s</jats:italic><jats:sub>GB</jats:sub> values are measured by means of a cathodoluminescence analysis of Na‐/K‐free CIGSe layers as well as on CIGSe layers on Mo/sapphire substrates, which are submitted to only NaF or only KF postdeposition treatments. Overall, passivating effects on GBs by neither Na nor K can be confirmed. The GB recombination velocities seem to remain on the same order of magnitude, in average about 10<jats:sup>3</jats:sup>–10<jats:sup>4</jats:sup> cm s<jats:sup>−1</jats:sup>, irrespective of whether CIGSe thin films are Na‐/K‐free or Na‐/K‐containing.</jats:p></jats:sec>

Topics
  • impedance spectroscopy
  • surface
  • grain
  • thin film
  • size-exclusion chromatography
  • Alkali metal