| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Frégnaux, Mathieu
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (25/25 displayed)
- 2024Fine tuning of Nb-incorporated TiO2 thin films by atomic layer deposition and application as efficient electron transport layer in perovskite solar cellscitations
- 2024Fine tuning of Nb-incorporated TiO2 thin films by atomic layer deposition and application as efficient electron transport layer in perovskite solar cellscitations
- 2024Breaking 1.7 V Open Circuit Voltage in Large Area Transparent Perovskite Solar Cells Using Interfaces Passivationcitations
- 2024Interface defect formation for atomic layer deposition of SnO2 on metal halide perovskitescitations
- 2024Breaking 1.7 V Open Circuit Voltage in Large Area Transparent Perovskite Solar Cells Using Interfaces Passivationcitations
- 2024In situ evaluation of the strontium vandate oxide reactivity by NAP-XPS
- 2023Influence of X-Ray Irradiation During Photoemission Studies on Halide Perovskite-Based Devicescitations
- 2023Elucidating Interfacial Limitations Induced by Tin Oxide Electron Selective Layer Grown by Atomic Layer Deposition in N−I−P Perovskite-Based Solar Cellscitations
- 2023Breaking 1.7V open circuit voltage in large area transparent perovskite solar cells using bulk and interfaces passivation.citations
- 2023Formation and Etching of the Insulating Sr‐Rich V 5+ Phase at the Metallic SrVO 3 Surface Revealed by Operando XAS Spectroscopy Characterizationscitations
- 2023Formation and Etching of the Insulating Sr‐Rich V<sup>5+</sup> Phase at the Metallic SrVO<sub>3</sub> Surface Revealed by Operando XAS Spectroscopy Characterizationscitations
- 2022Photocatalytic nanocomposite anatase–rutile TiO2 coatingcitations
- 2022Photocatalytic nanocomposite anatase–rutile TiO2 coatingcitations
- 2022On the equilibrium electrostatic potential and light-induced charge redistribution in halide perovskite structurescitations
- 2022Oxide thin film depth profiling: interest and limitations of argon sputtering for photoemission spectroscopy
- 2021Carrier gradients and the role of charge selective contacts in lateral heterojunction all back contact perovskite solar cellscitations
- 2021XPS monitoring of SrVO3 thin films from demixing to air ageing: The asset of treatment in watercitations
- 2021Highly Transparent and Conductive Indium‐Free Vanadates Crystallized at Reduced Temperature on Glass Using a 2D Transparent Nanosheet Seed Layercitations
- 2020Improving the Activity of Fe/C/N ORR Electrocatalyst Using Double Ammonia Promoted CO2 Laser Pyrolysis
- 2020Three dimensional resistance mapping of self-organized Sr3V2O8 nanorods on metallic perovskite SrVO3 matrixcitations
- 2020Transfer of Epitaxial SrTiO 3 Nanothick Layers Using Water-Soluble Sacrificial Perovskite Oxidescitations
- 2018Synthesis and characterization of Carbon/Nitrogen/Iron based nanoparticles by laser pyrolysis as non-noble metal electrocatalysts for oxygen reductioncitations
- 2018The Evaluation of the Perturbations Induced By Ionic Bombardment on Surfaces: A Challengefor Interfacial Electrochemistry
- 2017Direct Writing on Copper Ion Doped Silica Films by Electrogeneration of Metallic Microstructurescitations
- 2014Ion beam synthesis of embedded III‐As nanocrystals in silicon substratecitations
Places of action
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article
Influence of X-Ray Irradiation During Photoemission Studies on Halide Perovskite-Based Devices
Abstract
Metal halide perovskites (MHPs) are semiconductors with promising application in optoelectronic devices, particularly, in solar cell technologies. The chemical and electronic properties of MHPs at the surface and interfaces with adjacent layers dictate charge transfer within stacked devices and ultimately the efficiency of the latter. X-ray photoelectron spectroscopy is a powerful tool to characterize these material properties. However, the X-ray radiation itself can potentially affect the MHP and therefore jeopardize the reliability of the obtained information. In this work, the effect of X-ray irradiation is assessed on Cs0.05MA0.15FA0.8Pb(I0.85Br0.15)3 (MA for CH3NH3, and FA for CH2(NH2)2) MHP thin-film samples in a half-cell device. There is a comparison of measurements acquired with synchrotron radiation and a conventional laboratory source for different times. Changes in composition and core levels binding energies are observed in both cases, indicating a modification of the chemical and electronic properties. The results suggest that changes observed over minutes with highly brilliant synchrotron radiation are likely occurring over hours when working with a lab-based source providing a lower photon flux. The possible degradation pathways are discussed, supported by steady-state photoluminescence analysis. The work stresses the importance of beam effect assessment at the beginning of XPS experiments of MHP samples.