Materials Map

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2023Complementary spectroscopic and electrochemical analysis of the sealing of micropores in hexamethyldisilazane plasma polymer films by Al<sub>2</sub>O<sub>3</sub> atomic layer deposition1citations

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Grundmeier, Guido
1 / 13 shared
Arcos, Teresa De Los
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Zanders, David
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Devi, Anjana
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Preischel, Florian
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2023

Co-Authors (by relevance)

  • Grundmeier, Guido
  • Arcos, Teresa De Los
  • Zanders, David
  • Devi, Anjana
  • Preischel, Florian
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article

Complementary spectroscopic and electrochemical analysis of the sealing of micropores in hexamethyldisilazane plasma polymer films by Al<sub>2</sub>O<sub>3</sub> atomic layer deposition

  • Grundmeier, Guido
  • Xie, Xiaofan
  • Arcos, Teresa De Los
  • Zanders, David
  • Devi, Anjana
  • Preischel, Florian
Abstract

<jats:p>In the present study, the effects of oxygen plasma treatment and subsequent 2 nm thin Al<jats:sub>2</jats:sub>O<jats:sub>3</jats:sub> film deposition by atomic layer deposition on about 30 nm thick hexamethyldisilazane polymer layers are investigated by using a combination of spectroscopic and electrochemical analysis. The investigations focus on the microporosity of the corresponding films and their structural changes. Upon oxygen plasma treatment, the surface near region of the films is converted into SiO<jats:sub>x</jats:sub>, and the microporosity is increased. Atomic layer deposition of Al<jats:sub>2</jats:sub>O<jats:sub>3</jats:sub> on the plasma oxidized films leads to the decrease of pore sizes and an effective sealing. A correlation between the film microporosity and the change of hydroxyl groups of the films with the adsorption of water was established by ellipsometric porosimetry and in situ Fourier transform infrared (FTIR) spectroscopy. Moreover, electrochemical analysis provided complementary information on the electrolyte up‐take in the differently conditioned thin films.</jats:p>

Topics
  • impedance spectroscopy
  • pore
  • surface
  • polymer
  • thin film
  • Oxygen
  • atomic layer deposition
  • porosimetry
  • electrochemical characterization method