Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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693.932 PEOPLE
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Naji, M.
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Schwarz, R.

  • Google
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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (15/15 displayed)

  • 2022Spin-induced asymmetry reaction - The formation of asymmetric carbon by electropolymerization22citations
  • 2014Tungsten trioxide nanostructured electrodes for organic dye sensitised solar cells2citations
  • 2013Optical properties of lead-free NKN films from transmission and spectral ellipsometry1citations
  • 2012Complex dielectric function in lead-free NKN films1citations
  • 2012Transfer characteristic of zinc nitride based thin film transistors16citations
  • 2012Development of lead-free materials for piezoelectric energy harvesting5citations
  • 2012Secondary electron emission yield (SEY) in amorphous and graphitic carbon films prepared by PLD3citations
  • 2010Local electromechanical properties of ZnO thin films and microcrystalscitations
  • 2010Optical properties of TiO(2) thin films prepared by chemical spray pyrolysis from aqueous solutions22citations
  • 2010Local piezoelectric properties of ZnO thin films prepared by RF-plasma-assisted pulsed-laser deposition method52citations
  • 2010RF-plasma assisted PLD growth of Zn3N2 thin films26citations
  • 2009Morphological and optical properties of silicon thin films by PLD9citations
  • 2008Study of trap states in zinc oxide (ZnO) thin films for electronic applications25citations
  • 2007ZnO films grown by laser ablation with and without oxygen CVD17citations
  • 2007Photoinduced excess carrier dynamics in PLD-grown ZnO2citations

Places of action

Chart of shared publication
K., Das T.
1 / 2 shared
K., Bhowmick D.
1 / 1 shared
E., Diesendruck C.
1 / 1 shared
Santra, K.
1 / 2 shared
K., Mondal A.
1 / 2 shared
Tassinari, F.
1 / 5 shared
Naaman, R.
1 / 8 shared
Bhattacharyya, Sr
5 / 5 shared
Ayouchi, R.
14 / 16 shared
Ramos Barrado, Jrr
1 / 1 shared
Santos, L.
4 / 14 shared
Mardolcar, U.
2 / 2 shared
Leal, M.
2 / 2 shared
Kholkin, Andrei L.
5 / 435 shared
Rai, R.
2 / 27 shared
Coondoo, I.
2 / 21 shared
Bdikin, I.
2 / 53 shared
Pinnisch, M.
1 / 1 shared
Bhattacharaya, S.
1 / 1 shared
Lopes, Rp
1 / 1 shared
Bundaleski, N.
1 / 8 shared
Taborelli, M.
1 / 9 shared
Moutinho, A.
1 / 1 shared
Alberti, M.
1 / 2 shared
Aguilera, L.
1 / 2 shared
Teodoro, O.
2 / 2 shared
Gracio, J.
2 / 19 shared
Bdikin, Ik
2 / 18 shared
Silibin, M.
1 / 4 shared
Gavrilov, S.
1 / 1 shared
Martin, F.
1 / 32 shared
Casteleiro, C.
3 / 3 shared
Barrado, Jr
1 / 1 shared
Conde, O.
2 / 10 shared
Ramalho, R.
1 / 1 shared
Melo, Lv
1 / 2 shared
Almeida, R.
1 / 7 shared
Alves, E.
1 / 129 shared
Marques, Cp
1 / 1 shared
Stallinga, P.
1 / 4 shared
Bentes, L.
2 / 2 shared
Gomes, Hl
1 / 1 shared
Santos, C.
1 / 8 shared
Monteiro, T.
1 / 19 shared
Sanguino, P.
1 / 2 shared
Peres, M.
1 / 11 shared
Queiroz, P.
1 / 1 shared
Morgado, E.
1 / 1 shared
Niehus, M.
1 / 1 shared
Fedorov, A.
1 / 15 shared
Martinho, J.
1 / 1 shared
Kunst, M.
1 / 2 shared
Wuensch, F.
1 / 1 shared
Chart of publication period
2022
2014
2013
2012
2010
2009
2008
2007

Co-Authors (by relevance)

  • K., Das T.
  • K., Bhowmick D.
  • E., Diesendruck C.
  • Santra, K.
  • K., Mondal A.
  • Tassinari, F.
  • Naaman, R.
  • Bhattacharyya, Sr
  • Ayouchi, R.
  • Ramos Barrado, Jrr
  • Santos, L.
  • Mardolcar, U.
  • Leal, M.
  • Kholkin, Andrei L.
  • Rai, R.
  • Coondoo, I.
  • Bdikin, I.
  • Pinnisch, M.
  • Bhattacharaya, S.
  • Lopes, Rp
  • Bundaleski, N.
  • Taborelli, M.
  • Moutinho, A.
  • Alberti, M.
  • Aguilera, L.
  • Teodoro, O.
  • Gracio, J.
  • Bdikin, Ik
  • Silibin, M.
  • Gavrilov, S.
  • Martin, F.
  • Casteleiro, C.
  • Barrado, Jr
  • Conde, O.
  • Ramalho, R.
  • Melo, Lv
  • Almeida, R.
  • Alves, E.
  • Marques, Cp
  • Stallinga, P.
  • Bentes, L.
  • Gomes, Hl
  • Santos, C.
  • Monteiro, T.
  • Sanguino, P.
  • Peres, M.
  • Queiroz, P.
  • Morgado, E.
  • Niehus, M.
  • Fedorov, A.
  • Martinho, J.
  • Kunst, M.
  • Wuensch, F.
OrganizationsLocationPeople

document

Optical properties of TiO(2) thin films prepared by chemical spray pyrolysis from aqueous solutions

  • Schwarz, R.
  • Martin, F.
  • Ayouchi, R.
  • Casteleiro, C.
  • Barrado, Jr
Abstract

Titanium dioxide (TiO(2)) is known to have three different kinds of polymorphous crystalline forms: rutile, anatase, and brookite. The rutile phase is always formed at higher temperatures, while the anatase phase is formed at lower temperatures and transformed into rutile phase above 800 degrees C. Various deposition techniques have been developed for depositing TiO(2) thin films, including evaporation, sputtering, chemical vapour deposition and thermal oxidation of titanium. Among them, the Chemical Spray Pyrolysis (CSP) technique has many advantages, such as good conformal coverage, the possibility of epitaxial growth and the application to large area deposition. Also, this method is low cost and it is easy to control the deposition growth parameters. In the present work, TiO(2) thin films have been deposited on p-Si (001) and fused silica substrates by Chemical Spray Pyrolysis (CSP) method from aqueous solution containing titanium (IV) isopropoxide (Ti[OCH(CH(3))(2)](4). As-deposited thin films show anatase polycrystalline structure, and rutile phase formed for films annealed at 750 degrees C. SEM images have confirmed a smooth and crack-free surface with low surface roughness. X-ray photoelectron spectroscopy (XPS) combined with 4 keV Ar(+) depth profiling has shown that crystallized films correspond to TiO(2). Residual carbon coming from the organic precursor solution is only detected at the surface of the film. Thin films deposited on fused silica were highly transparent (more than 85 %), with an indirect optical band gap of 3,43 and 3,33 eV for as-deposited and annealed films, respectively, and refractive indexes in the range between 2.01-2.29. Spectroscopic Ellipsometry (SE) also has been used to extract optical parameters. SE data fitted to triple-layer physical model revealed the same tendency to increase refractive index in annealed films. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

Topics
  • Deposition
  • impedance spectroscopy
  • surface
  • Carbon
  • phase
  • scanning electron microscopy
  • thin film
  • x-ray photoelectron spectroscopy
  • crack
  • ellipsometry
  • titanium
  • evaporation
  • spray pyrolysis