Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2022Revisiting the surface characterization of plasma-modified polymers4citations

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Chart of shared publication
Reniers, François
1 / 2 shared
Berckmans, Jorane
1 / 1 shared
Demaude, Annaëlle
1 / 1 shared
Terryn, Herman
1 / 124 shared
Baert, Kitty
1 / 23 shared
Hauffman, Tom
1 / 59 shared
Chart of publication period
2022

Co-Authors (by relevance)

  • Reniers, François
  • Berckmans, Jorane
  • Demaude, Annaëlle
  • Terryn, Herman
  • Baert, Kitty
  • Hauffman, Tom
OrganizationsLocationPeople

article

Revisiting the surface characterization of plasma-modified polymers

  • Reniers, François
  • Merche, Delphine
  • Berckmans, Jorane
  • Demaude, Annaëlle
  • Terryn, Herman
  • Baert, Kitty
  • Hauffman, Tom
Abstract

<p>Many papers dealing with the surface analysis of plasma polymers or plasma-modified polymers report the use of X-ray photoelectron spectroscopy (XPS) to quantify the surface composition. However, most of the time, quantification is performed using software that includes an equation based on the assumption that the sample is homogeneous in composition. However, for plasma-treated samples, this is often not the case. The usual analysis of XPS spectra does not allow the exact quantification in the case of an inhomogeneous sample. In this paper, we show that it is possible to obtain a depth profile of the composition, and a more accurate surface composition by using another mathematical approach for surface quantification, being QUASES Tougaard.</p>

Topics
  • impedance spectroscopy
  • surface
  • polymer
  • x-ray photoelectron spectroscopy