Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Schubert, Eva

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (13/13 displayed)

  • 2024In-cycle evolution of thickness and roughness parameters during oxygen plasma enhanced ZnO atomic layer deposition using in situ spectroscopic ellipsometrycitations
  • 2020Precursor-surface interactions revealed during plasma-enhanced atomic layer deposition of metal oxide thin films by in-situ spectroscopic ellipsometry13citations
  • 2020Precursor-surface interactions revealed during plasma-enhanced atomic layer deposition of metal oxide thin films by in-situ spectroscopic ellipsometry13citations
  • 2018Critical-point model dielectric function analysis of WO3 thin films deposited by atomic layer deposition techniques7citations
  • 2016Anisotropy, band-to-band transitions, phonon modes, and oxidation properties of cobalt-oxide core-shell slanted columnar thin films16citations
  • 2015Structural and optical properties of cobalt slanted nanopillars conformally coated with few-layer graphene8citations
  • 2015Optical anisotropy of porous polymer film with inverse slanted nanocolumnar structure revealed via generalized spectroscopic ellipsometry6citations
  • 2012Nanomagnetic skyrmions9citations
  • 2012Optical properties of cobalt slanted columnar thin films passivated by atomic layer deposition53citations
  • 2012Aging Effects of As-deposited and Passivated Cobalt Slanted Columnar Thin Films3citations
  • 2011Length scales of interactions in magnetic, dielectric, and mechanical nanocomposites7citations
  • 2007Sub‐Wavelength Antireflection Coatings From Nanostructure Sculptured Thin Films4citations
  • 2005Ion beam sputter deposition of soft x-ray Mo∕Si multilayer mirrors13citations

Places of action

Chart of shared publication
Traouli, Yousra
1 / 1 shared
Schubert, Mathias
9 / 15 shared
Schmidt, Daniel
4 / 14 shared
Sema, G. Kilic
1 / 1 shared
Kilic, Ufuk
3 / 4 shared
Hilfiker, Matthew
1 / 3 shared
Schoeche, Stefan
1 / 2 shared
Sekora, Derek
5 / 5 shared
Langell, Marjorie
2 / 2 shared
Valloppilly, Shah
3 / 4 shared
Ianno, Natale
3 / 3 shared
Gilbert, Simeon
2 / 2 shared
Mock, Alyssa
4 / 5 shared
Melendez, Giselle
1 / 1 shared
Korlacki, Rafał
2 / 3 shared
Sinitskii, Alexander
2 / 4 shared
Hofmann, Tino
2 / 2 shared
Briley, Chad
1 / 1 shared
Wilson, Peter
1 / 8 shared
Lipatov, Alexey
1 / 3 shared
Wilson, Peter M.
1 / 1 shared
Liang, Dan
1 / 1 shared
Rice, Charles
1 / 1 shared
Schmidt, D.
1 / 6 shared
Enders, A.
1 / 3 shared
Zhang, Rui
1 / 14 shared
Li, Zhen
1 / 17 shared
Kirby, Roger D.
1 / 1 shared
Sellmyer, D. J.
1 / 2 shared
Skomski, Ralph
2 / 2 shared
Hofmann, T.
1 / 10 shared
Balamurugan, B.
1 / 2 shared
Enders, Axel
1 / 2 shared
Sellmyer, David J.
1 / 1 shared
Neumann, H.
1 / 2 shared
Frost, F.
1 / 1 shared
Rauschenbach, B.
1 / 6 shared
Ziberi, B.
1 / 1 shared
Wagner, G.
1 / 89 shared
Chart of publication period
2024
2020
2018
2016
2015
2012
2011
2007
2005

Co-Authors (by relevance)

  • Traouli, Yousra
  • Schubert, Mathias
  • Schmidt, Daniel
  • Sema, G. Kilic
  • Kilic, Ufuk
  • Hilfiker, Matthew
  • Schoeche, Stefan
  • Sekora, Derek
  • Langell, Marjorie
  • Valloppilly, Shah
  • Ianno, Natale
  • Gilbert, Simeon
  • Mock, Alyssa
  • Melendez, Giselle
  • Korlacki, Rafał
  • Sinitskii, Alexander
  • Hofmann, Tino
  • Briley, Chad
  • Wilson, Peter
  • Lipatov, Alexey
  • Wilson, Peter M.
  • Liang, Dan
  • Rice, Charles
  • Schmidt, D.
  • Enders, A.
  • Zhang, Rui
  • Li, Zhen
  • Kirby, Roger D.
  • Sellmyer, D. J.
  • Skomski, Ralph
  • Hofmann, T.
  • Balamurugan, B.
  • Enders, Axel
  • Sellmyer, David J.
  • Neumann, H.
  • Frost, F.
  • Rauschenbach, B.
  • Ziberi, B.
  • Wagner, G.
OrganizationsLocationPeople

article

Sub‐Wavelength Antireflection Coatings From Nanostructure Sculptured Thin Films

  • Schubert, Eva
Abstract

<jats:title>Abstract</jats:title><jats:p>Nanostructure sculptured thin films from SiO<jats:sub>2</jats:sub> are grown on quartz substrates by ion beam sputter deposition using rotating substrate motion accommodated to an oblique angle of incidence for the particle flux. Structural peculiarities of sculptured thin films have an intriguing impact on the optical response upon reflection of light with different wavelengths. The reflectivity of quartz substrates coated with SiO<jats:sub>2</jats:sub> sub‐wavelength nanostructures is simulated by means of effective medium theory and antireflection is predicted for the deep ultraviolet spectral region. Spectroscopic ellipsometry and reflectivity measurements are performed on SiO<jats:sub>2</jats:sub> sculptured thin films and antireflection near <jats:italic>λ</jats:italic> = 193 nm is found. (© 2007 WILEY‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</jats:p>

Topics
  • Deposition
  • impedance spectroscopy
  • theory
  • thin film
  • ellipsometry