| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Schwarz, Ulrich
Chemnitz University of Technology
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (10/10 displayed)
- 2022On the Fabrication and Characterization of Polymer-Based Waveguide Probes for Use in Future Optical Cochlear Implantscitations
- 2022Mechanische Eigenschaften von Schälfurnierlagen in Sperrhölzern
- 2016Superconductivity in Weyl semimetal candidate MoTe2citations
- 2014Ca3Pt4+xGe13−y and Yb3Pt4Ge13: new derivatives of the Pr3Rh4Sn13 structure typecitations
- 2011High-pressure synthesis of rare-earth metal disulfides and diselenides LnX2 (Ln = Sm, Gd, Tb, Dy, Ho, Er and Tm; X = S, Se)citations
- 2010Thermal, Magnetic, Electronic and Superconducting Properties of Rare-Earth Metal Pentagermanides REGe5 (RE = La, Nd, Sm, Gd) and Synthesis of TbGe5citations
- 2009Dynamic disorder of Bi82+ clusters in the plastic phase (Bi8)3Bi[InI4]9citations
- 2008The first silicon-based cationic clathrate III with high thermal stability: Si172-xPxTey (x=2y, y>20).citations
- 2006Influence of an in situ-deposited SiN_x intermediate layer inside GaN and AlGaN layers on SiC substrates
- 2006Influence of an in situ-deposited SiNx intermediate layer inside GaN and AlGaN layers on SiC substrates
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article
The first silicon-based cationic clathrate III with high thermal stability: Si172-xPxTey (x=2y, y>20).
Abstract
A new representative of a very rare clathrate III family, Si130P42Te21, has been synthesized from the elements. It crystallizes in the tetragonal space group P4(2)/mnm (no. 136) with the unit cell parameters a=19.2632(3) angstroms, c=10.0706(2) angstroms. Single crystal X-ray diffraction and solid state 31P NMR revealed a non-random distribution of phosphorus atoms over the framework positions. The crystal structure features a peculiar packing of large polyhedra Te@(Si/P)(n) never observed before for cationic clathrates. Despite the structural complexity, the composition of the novel clathrate Is in accordance with the Zintl rule, which was confirmed by a combination of optical metallography, scanning electron microscopy (SEM) and wavelength dispersive X-ray spectroscopy (WDXS), as well as by diamagnetic and semiconducting behavior of the synthesized phase. Clathrate Si130P42Te21 exhibits the highest reported thermal stability for this class of materials, it decomposes at 1510 K. This opens new perspectives for the creation of clathrate-based materials for high-temperature applications.