Materials Map

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Topics

Publications (1/1 displayed)

  • 2021Oxidative Chemical Vapor Deposition of Conducting Polymer Films on Nanostructured Surfaces for Piezoresistive Sensor Applications21citations

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Coclite, Anna Maria
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2021

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  • Coclite, Anna Maria
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article

Oxidative Chemical Vapor Deposition of Conducting Polymer Films on Nanostructured Surfaces for Piezoresistive Sensor Applications

  • Coclite, Anna Maria
  • Muralter, Fabian
Abstract

<jats:title>Abstract</jats:title><jats:p>In this study, a novel, fully polymeric setup for piezoresistive sensing is prepared and tested. Monolayers of polystyrene (PS) nanospheres are assembled on flexible polyethylene naphthalate substrates. Subsequently, thin layers (≈50–100 nm) of poly(3,4‐ethylenedioxythiophene) (PEDOT) are deposited conformally around the spheres by oxidative chemical vapor deposition (oCVD). Voltage−current characteristics and direct resistance measurements are performed to test the electrical properties of the samples in their unstrained state and their piezoresistive response during bending. Substrate deposition temperature (<jats:italic>T</jats:italic><jats:sub>sub</jats:sub>) and film thickness (<jats:italic>t</jats:italic><jats:sub>PEDOT</jats:sub>) are used as parameters to alter properties of the PEDOT thin films; increased <jats:italic>T</jats:italic><jats:sub>sub</jats:sub> and <jats:italic>t</jats:italic><jats:sub>PEDOT</jats:sub> lead to samples exhibiting lower intrinsic resistance. The electrical conductivity of the samples is estimated to range as high as tens of S cm<jats:sup>−1</jats:sup>. Dopant exchange of the oCVD‐PEDOT layer (intrinsically, chlorine‐doped) is performed by putting the samples in 0.5 <jats:sc>m</jats:sc> sulfuric acid, which decreases their resistance by ≈1/3. Regarding the piezoresistive properties of the devices, acid treatment, higher <jats:italic>T</jats:italic><jats:sub>sub</jats:sub> and <jats:italic>t</jats:italic><jats:sub>PEDOT</jats:sub> (thus, lower intrinsic resistance) yield samples with increased response. As a result, gauge factors as high as 11.4 are achieved. Due to their flexibility and low‐cost, the proposed structures can be readily employed as skin‐inspired or wearable electronic devices.</jats:p>

Topics
  • impedance spectroscopy
  • surface
  • polymer
  • thin film
  • electrical conductivity
  • chemical vapor deposition