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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Paetzold, Ulrich Wilhelm
Karlsruhe Institute of Technology
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (19/19 displayed)
- 2024Hybrid Two‐Step Inkjet‐Printed Perovskite Solar Cellscitations
- 2024Modeling and Fundamental Dynamics of Vacuum, Gas, and Antisolvent Quenching for Scalable Perovskite Processescitations
- 2024Energy Yield Modeling of Perovskite–Silicon Tandem Photovoltaics: Degradation and Total Lifetime Energy Yieldcitations
- 2023Bright circularly polarized photoluminescence in chiral layered hybrid lead-halide perovskitescitations
- 2023Evaporated Self‐Assembled Monolayer Hole Transport Layers: Lossless Interfaces in <i>p‐i‐n</i> Perovskite Solar Cellscitations
- 2023Decoupling Bimolecular Recombination Mechanisms in Perovskite Thin Films Using Photoluminescence Quantum Yield
- 2023Surface Saturation Current Densities of Perovskite Thin Films from Suns-Photoluminescence Quantum Yield Measurements
- 2023Intensity Dependent Photoluminescence Imaging for In‐Line Quality Control of Perovskite Thin Film Processingcitations
- 2022Energy Yield Modeling of Bifacial All‐Perovskite Two‐Terminal Tandem Photovoltaicscitations
- 2022Mitigation of Open‐Circuit Voltage Losses in Perovskite Solar Cells Processed over Micrometer‐Sized‐Textured Si Substratescitations
- 2021A Self‐Assembly Method for Tunable and Scalable Nano‐Stamps: A Versatile Approach for Imprinting Nanostructurescitations
- 2021Analytical Study of Solution-Processed Tin Oxide as Electron Transport Layer in Printed Perovskite Solar Cellscitations
- 2021From Groundwork to Efficient Solar Cells: On the Importance of the Substrate Material in Co‐Evaporated Perovskite Solar Cellscitations
- 2021Exciton versus free carrier emission: Implications for photoluminescence efficiency and amplified spontaneous emission thresholds in quasi-2D and 3D perovskitescitations
- 2020Chemical vapor deposited polymer layer for efficient passivation of planar perovskite solar cellscitations
- 2019Continuous wave amplified spontaneous emission in phase-stable lead halide perovskitescitations
- 2019Vacuum‐Assisted Growth of Low‐Bandgap Thin Films (FA$_{0.8}$MA$_{0.2}$Sn$_{0.5}$Pb$_{0.5}$I$_{3}$) for All‐Perovskite Tandem Solar Cellscitations
- 2019Inkjet‐Printed Micrometer‐Thick Perovskite Solar Cells with Large Columnar Grainscitations
- 2017All-Angle Invisibility Cloaking of Contact Fingers on Solar Cells by Refractive Free-Form Surfacescitations
Places of action
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article
Intensity Dependent Photoluminescence Imaging for In‐Line Quality Control of Perovskite Thin Film Processing
Abstract
Large area fabrication of high-quality polycrystalline perovskite thin filmsremains one of the key challenges for the commercial readiness of perovskitephotovoltaic (PV). To enable high-throughput and high-yield processing,reliable and fast in-line characterization methods are required. The presentwork reports on a non-invasive characterization technique based onintensity-dependent photoluminescence (PL) imaging. The change in PLintensity as a function of excitation power density can be approximated by apower-law with exponent k, which is a useful quality indicator for theperovskite layer, providing information about the relative magnitudes ofradiative and non-radiative recombination. By evaluating k-parameter mapsinstead of more established PL intensity images, 2D information is obtainedthat is robust to optically induced artifacts such as intensity variations inexcitation and reflection. Application to various half stacks of a perovskitesolar cell showcase its ability to determine the importance of the interfacebetween the charge transporting and perovskite layers. In addition, thek-parameter correlates to the bulk passivation concentration, enabling rapidassessment of open-circuit voltage variations in the range of 20 mV.Considering expected improvements in data acquisition speed, the presentedk-imaging method will possibly be obtained in real-time, providing large-areaquality control in industrial-scale perovskite PV production.