| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Orekhov, Andrey
University of Antwerp
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (14/14 displayed)
- 2024Enhanced Piezoelectricity by Polarization Rotation through Thermal Strain Manipulation in PbZr<sub>0.6</sub>Ti<sub>0.4</sub>O<sub>3</sub> Thin Films
- 2024On-chip very low strain rate rheology of amorphous olivine filmscitations
- 2023Insights into the Photoelectrocatalytic Behavior of gCN-Based Anode Materials Supported on Ni Foamscitations
- 2023Tailoring Mechanical Properties of a-C:H:Cr Coatings
- 2023Tailoring Mechanical Properties of a-C:H:Cr Coatings
- 2022Nanoengineered thin film metallic glasses with outstanding mechanical/functional properties
- 2021Toward novel stretchable electronics with nanostructured metallic glass films
- 2021Optical versus electron diffraction imaging of Twist-angle in 2D transition metal dichalcogenide bilayerscitations
- 2021Towards ductilization of high strength 7XXX aluminium alloys via microstructural modifications obtained by friction stir processing and heat treatmentscitations
- 2021Novel nanostructured thin film metallic glasses for stretchable electronics
- 2021Rheology of amorphous olivine thin films characterized by nanoindentationcitations
- 2021Novel class of nanostructured metallic glass films with superior and tunable mechanical propertiescitations
- 2021Novel class of nanostructured metallic glass films with superior and tunable mechanical propertiescitations
- 2020Unravelling stacking order in epitaxial bilayer MX₂ using 4D-STEM with unsupervised learningcitations
Places of action
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article
Enhanced Piezoelectricity by Polarization Rotation through Thermal Strain Manipulation in PbZr<sub>0.6</sub>Ti<sub>0.4</sub>O<sub>3</sub> Thin Films
Abstract
<jats:title>Abstract</jats:title><jats:p>Lead based bulk piezoelectric materials, e.g., PbZr<jats:sub>x</jats:sub>Ti<jats:sub>1‐x</jats:sub>O<jats:sub>3</jats:sub> (PZT), are widely used in electromechanical applications, sensors, and transducers, for which optimally performing thin films are needed. The results of a multi‐domain Landau–Ginzberg‐Devonshire model applicable to clamped ferroelectric thin films are used to predict the lattice symmetry and properties of clamped PZT thin films on different substrates. Guided by the thermal strain phase diagrams that are produced by this model, experimentally structural transitions are observed. These can be related to changes of the piezoelectric properties in PZT(x = 0.6) thin films that are grown on CaF<jats:sub>2</jats:sub>, SrTiO<jats:sub>3</jats:sub> (STO) and 70% PbMg<jats:sub>1/3</jats:sub>Nb<jats:sub>2/3</jats:sub>O<jats:sub>3</jats:sub>‐30% PbTiO<jats:sub>3</jats:sub> (PMN‐PT) substrates by pulsed laser deposition. Through temperature en field dependent in situ X‐ray reciprocal space mapping (RSMs) and piezoelectric force microscopy (PFM), the low symmetry monoclinic phase and polarization rotation are observed in the film on STO and can be linked to the measured enhanced properties. The study identifies a monoclinic ‐rhombohedral <jats:bold><jats:italic>M<jats:sub>C</jats:sub></jats:italic></jats:bold>‐<jats:bold><jats:italic>M<jats:sub>A</jats:sub></jats:italic></jats:bold>‐<jats:bold><jats:italic>R</jats:italic></jats:bold> crystal symmetry path as the polarization rotation mechanism. The films on CaF<jats:sub>2</jats:sub> and PMN‐PT remain in the same symmetry phase up to the ferroelectric‐paraelectric phase transition, as predicted. These results support the validity of the multi‐domain model which provides the possibility to predict the behavior of clamped, piezoelectric PZT thin films, and design films with enhanced properties.</jats:p>