• Claumarchirant, José Francisco Serrano
• Seijas-Da Silva, Alvaro
• Nasiri, Mohammad Ali
• Cantarero, Andres
• Canet-Ferrer, Josep
• Abellán, Gonzalo
• Gómez, Clara M.

Abstract

<jats:title>Abstract</jats:title><jats:p>In this work, ultrathin nickel films are developed for application as transparent electrodes in thermoelectric devices. The quality of the films is determined systematically by electrical, optical, and morphological characterization in a series of samples with different thickness. The thermal properties of the films show a dramatic dependence of the Seebeck coefficient on the film thickness. This dependence, with values ranging from −16 to +5 ᵰ7V K<jats:sup>−1</jats:sup> for thicknesses from 10 to 2 nm, includes a change in the behavior of the thermoelectric response from n‐ to p‐type. It has also been demonstrated that the accurate estimation of the thermal conductivity in thin films is challenging due to substrate effects. In this situation, a differential measurement method based on scanning thermal microscopy is proposed, as in these conditions the measurements are less sensitive to the substrate effects. In further works, the dependence of the thermal properties of ultrathin nickel films can be exploited as a tuning parameter for the design of thermoelectric devices.</jats:p>

Topics

• impedance spectroscopy
• nickel
• thin film
• laser emission spectroscopy
• thermal conductivity
• microscopy