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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Milichko, Valentin
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (8/8 displayed)
- 2024Metal-organic framework single crystal for in-memory neuromorphic computing with a light controlcitations
- 2024Light-driven anisotropy of 2D metal-organic framework single crystal for repeatable optical modulationcitations
- 2024<i>In situ</i> tracking the phase change in metastable copper oxide thin film via thermal oxidation
- 2023The most sustainable high entropy alloys for the future
- 2023Nonlinear Metal–Organic Framework Crystals for Efficient Multicolor Coherent Optical Emissioncitations
- 2021Flexible Metal‐Organic Framework for Mechanical Sub Tbyte inch^(−2) Data Recording under Ambient Conditioncitations
- 2020Synergistic effect of plasma and laser processes in liquid for alloyed nanoparticles synthesiscitations
- 2017Multifold Emission Enhancement in Nanoimprinted Hybrid Perovskite Metasurfacescitations
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article
Flexible Metal‐Organic Framework for Mechanical Sub Tbyte inch^(−2) Data Recording under Ambient Condition
Abstract
<jats:title>Abstract</jats:title><jats:p>Metal‐organic frameworks (MOFs), demonstrating structural response on external stimuli, represent a promising family of crystalline materials for microelectronic and data storage devices. Herein, manipulation with MOF structure at the nanometer scale for the device miniaturization is still a challenge. Here, mechanical recording and reading the nanometer scale patterns onto flexible 2D MOF at ambient conditions are reported. Treatment of the MOF surface with a hot solvent decreases the roughness up to 1/7 of the layer thickness. Therefore, an atomic force microscope probe is allowed to cause the deformations with the spatial resolution up to 25 nm (≈0.1 Tbyte inch<jats:sup>−2</jats:sup> storage density) and the depth from 0.4 nm. Selective chemical etching by the solvent can further develop the pattern, while the integrity of the MOF structure maintains. The realization of the "read‐only‐memory" concept on flexible MOF at ambient conditions paves the way for next‐generation sustainable data storage materials.</jats:p>