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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Li, Zheshen
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (24/24 displayed)
- 2024Engineered Porosity ZnO Sensor Enriched with Oxygen Vacancies Enabled Extraordinary Sub-ppm Sensing of Hydrogen Sulfide and Nitrogen Dioxide Air Pollution Gases at Low Temperature in Air
- 2022Iron carbide formation on thin iron films grown on Cu(1 0 0)citations
- 2022WO 3 Monomers Supported on Anatase TiO 2 (101), −(001), and Rutile TiO 2 (110):A Comparative STM and XPS Studycitations
- 2022WO3 Monomers Supported on Anatase TiO2(101), −(001), and Rutile TiO2(110)citations
- 2022Iron carbide formation on thin iron films grown on Cu(1 0 0):FCC iron stabilized by a stable surface carbidecitations
- 2021Tuning oxygen vacancies and resistive switching properties in ultra-thin HfO 2 RRAM via TiN bottom electrode and interface engineeringcitations
- 2021Chemical Vapor Deposition of Cobalt and Nickel Ferrite Thin Films:Investigation of Structure and Pseudocapacitive Propertiescitations
- 2021Low-Temperature Growth of Graphene on a Semiconductorcitations
- 2021Low-Temperature Growth of Graphene on a Semiconductorcitations
- 2021Tuning oxygen vacancies and resistive switching properties in ultra-thin HfO2 RRAM via TiN bottom electrode and interface engineeringcitations
- 2021Chemical vapor deposition of cobalt and nickel ferrite thin films
- 2021Chemical Vapor Deposition of Cobalt and Nickel Ferrite Thin Films: Investigation of Structure and Pseudocapacitive Propertiescitations
- 2020From Precursor Chemistry to Gas Sensors:Plasma-Enhanced Atomic Layer Deposition Process Engineering for Zinc Oxide Layers from a Nonpyrophoric Zinc Precursor for Gas Barrier and Sensor Applicationscitations
- 2020Energy band alignment at the heterointerface between CdS and Ag-alloyed CZTScitations
- 2020Energy band alignment at the heterointerface between CdS and Ag-alloyed CZTScitations
- 2020Energy band alignment at the heterointerface between CdS and Ag-alloyed CZTScitations
- 2020From precursor chemistry to gas sensors
- 2018Formation of the layered conductive magnet CrCl 2 (pyrazine) 2 through redox-active coordination chemistrycitations
- 2018Formation of the layered conductive magnet CrCl2(pyrazine)2 through redox-active coordination chemistrycitations
- 2017Gold-supported two-dimensional cobalt oxyhydroxide (CoOOH) and multilayer cobalt oxide islandscitations
- 2017Growth of aluminum oxide on silicon carbide with an atomically sharp interfacecitations
- 2017Nanoporous Platinum Doped Cerium Oxides Thin Films Grown on Silicon Substrates:Ionic Platinum Localization and Stabilitycitations
- 2017Edge reactivity and water-assisted dissociation on cobalt oxide nanoislandscitations
- 2009Self-activated, self-limiting reactions on Si surfaces
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article
Chemical Vapor Deposition of Cobalt and Nickel Ferrite Thin Films: Investigation of Structure and Pseudocapacitive Properties
Abstract
<jats:title>Abstract</jats:title><jats:p>Transition metal ferrites, such as CoFe<jats:sub>2</jats:sub>O<jats:sub>4</jats:sub> (CFO) and NiFe<jats:sub>2</jats:sub>O<jats:sub>4</jats:sub> (NFO), have gained increasing attention as potential materials for supercapacitors. Since chemical vapor deposition (CVD) offers advantages like interface quality to the underlying substrates and the possibility for coverage of 3D substrates, two CVD processes are reported for CFO and NFO. Growth rates amount to 150 to 200 nm h<jats:sup>−1</jats:sup> and yield uniform, dense, and phase pure spinel ferrite films according to X‐ray diffraction (XRD), Raman spectroscopy, Rutherford backscattering spectrometry and nuclear reaction analysis (RBS/NRA) and scanning electron microscopy (SEM). Atom probe tomography (APT) and synchrotron X‐ray photoelectron spectroscopy (XPS) give insights into the vertical homogeneity and oxidation states in the CFO films. Cation disorder of CFO is analyzed for the first time from synchrotron‐based XPS. NFO is analyzed via lab‐based XPS. Depositions on conducting Ni and Ti substrates result in electrodes with pseudocapacitive behavior, as evidenced by cyclovoltammetry (CV) experiments. The interfacial capacitances of the electrodes are up to 185 µF cm<jats:sup>−2</jats:sup>.</jats:p>