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| Naji, M. |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Kočí, Jan | Prague |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Dickmann, Marcel
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Topics
Publications (7/7 displayed)
- 2024Positron lifetime study of ion-irradiated tungsten: Ion type and dose effectscitations
- 2021Porosimetry for Thin Films of Metal–Organic Frameworkscitations
- 2021Identification of lead vacancy defects in lead halide perovskitescitations
- 2020Solvent-Free Powder Synthesis and MOF-CVD Thin Films of the Large-Pore Metal-Organic Framework MAF-6citations
- 2020Morphology of Thin Film Composite Membranes Explored by Small-Angle Neutron Scattering and Positron-Annihilation Lifetime Spectroscopycitations
- 2018Annealing behavior of open spaces in AlON films studied by monoenergetic positron beamscitations
- 2017New insights into the nanostructure of innovative thin film solar cells gained by positron annihilation spectroscopycitations
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article
Porosimetry for Thin Films of Metal–Organic Frameworks
Abstract
<p>Thin films of crystalline and porous metal–organic frameworks (MOFs) have great potential in membranes, sensors, and microelectronic chips. While the morphology and crystallinity of MOF films can be evaluated using widely available techniques, characterizing their pore size, pore volume, and specific surface area is challenging due to the low amount of material and substrate effects. Positron annihilation lifetime spectroscopy (PALS) is introduced as a powerful method to obtain pore size information and depth profiling in MOF films. The complementarity of this approach to established physisorption-based methods such as quartz crystal microbalance (QCM) gravimetry, ellipsometric porosimetry (EP), and Kr physisorption (KrP) is illustrated. This comprehensive discussion on MOF thin film porosimetry is supported by experimental data for thin films of ZIF-8.</p>