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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Cruz, Alexander John
KU Leuven
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (12/12 displayed)
- 2024Molecular Layer Deposition of Zeolitic Imidazolate Framework-8 Filmscitations
- 2023Molecular Layer Deposition of Zeolitic Imidazolate Framework-8 Filmscitations
- 2023Molecular Layer Deposition of Zeolitic Imidazolate Framework-8 Filmscitations
- 2023Molecular Layer Deposition of Zeolitic Imidazolate Framework-8 Filmscitations
- 2022Unraveling the mechanism of the conversion treatment on Advanced High Strength Stainless Steels (AHSSS)citations
- 2021Porosimetry for Thin Films of Metal–Organic Frameworkscitations
- 2020Templated Solvent-Free Powder Synthesis and MOF-CVD Films of the Ultramicroporous Metal-Organic Framework alpha-Magnesium Formatecitations
- 2020Solvent-Free Powder Synthesis and Thin Film Chemical Vapor Deposition of a Zinc Bipyridyl-Triazolate Frameworkcitations
- 2020Integrated cleanroom process for the vapor-phase deposition of large-area zeolitic imidazolate framework thin filmscitations
- 2020Solvent-Free Powder Synthesis and MOF-CVD Thin Films of the Large-Pore Metal-Organic Framework MAF-6citations
- 2019Integrated Cleanroom Process for the Vapor-Phase Deposition of Large-Area Zeolitic Imidazolate Framework Thin Filmscitations
- 2019An integrated cleanroom process for the vapor-phase deposition of large-area zeolitic imidazolate framework thin filmscitations
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article
Porosimetry for Thin Films of Metal–Organic Frameworks
Abstract
<p>Thin films of crystalline and porous metal–organic frameworks (MOFs) have great potential in membranes, sensors, and microelectronic chips. While the morphology and crystallinity of MOF films can be evaluated using widely available techniques, characterizing their pore size, pore volume, and specific surface area is challenging due to the low amount of material and substrate effects. Positron annihilation lifetime spectroscopy (PALS) is introduced as a powerful method to obtain pore size information and depth profiling in MOF films. The complementarity of this approach to established physisorption-based methods such as quartz crystal microbalance (QCM) gravimetry, ellipsometric porosimetry (EP), and Kr physisorption (KrP) is illustrated. This comprehensive discussion on MOF thin film porosimetry is supported by experimental data for thin films of ZIF-8.</p>