Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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977 Locations available

693.932 PEOPLE
693.932 People People

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Schmidbauer, Martin

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (8/8 displayed)

  • 2024Electronic Synapses Enabled by an Epitaxial SrTiO3-δ / Hf0.5Zr0.5O2 Ferroelectric Field-Effect Memristor Integrated on Siliconcitations
  • 2024Selective Growth of GaP Crystals on CMOS-Compatible Si Nanotip Wafers by Gas Source Molecular Beam Epitaxy2citations
  • 2023Electronic Synapses Enabled by an Epitaxial SrTiO<sub>3‐δ</sub> / Hf<sub>0.5</sub>Z<sub>r0.5</sub>O<sub>2</sub> Ferroelectric Field‐Effect Memristor Integrated on Silicon15citations
  • 2023Y‐Stabilized ZrO2 as a Promising Wafer Material for the Epitaxial Growth of Transition Metal Dichalcogenidescitations
  • 2022Monolithic and catalyst-free selective epitaxy of InP nanowires on Siliconcitations
  • 2017Strain engineering of ferroelectric domains in KxNa1−xNbO3 epitaxial layerscitations
  • 2017Scanning X-ray nanodiffraction from ferroelectric domains in strained K0.75Na0.25NbO3 epitaxial films grown on (110) TbScO3citations
  • 2017Strain Engineering of Ferroelectric Domains in $KxNa_{1−x}NbO_3$ Epitaxial Layers33citations

Places of action

Chart of shared publication
Istrate, Cosmin
2 / 2 shared
Tsipas, Polychronis
2 / 8 shared
Dubourdieu, Catherine
2 / 19 shared
Dimoulas, Athanasios
2 / 8 shared
Hamouda, Wassim
2 / 3 shared
Zacharaki, Christina
2 / 2 shared
Pintilie, Lucian
2 / 11 shared
Siannas, Nikitas
2 / 2 shared
Kim, Dong Jik
2 / 6 shared
Netzel, Carsten
1 / 1 shared
Rodrigues-Weisensee, Adriana
1 / 1 shared
Kwasniewski, Albert
3 / 4 shared
Golz, Christian
2 / 2 shared
Capellini, Giovanni
1 / 26 shared
Skibitzki, Oliver
2 / 14 shared
Persichetti, Luca
1 / 8 shared
Spirito, Davide
2 / 23 shared
Kang, Songdan
1 / 1 shared
Kafi, Navid
1 / 1 shared
Hatami, Fariba
2 / 3 shared
Ryzhak, Diana
1 / 1 shared
Sadofev, Sergey
1 / 2 shared
Wang, Rongbin
1 / 4 shared
Koch, Norbert
1 / 40 shared
Martin, Jens
1 / 4 shared
Serrano, Jorge
1 / 3 shared
Mediavilla Martínez, Irene
1 / 2 shared
Dadgostar, Shabnam
1 / 3 shared
Kamath, Anagha
1 / 1 shared
Jimenez, Juan
1 / 5 shared
Niu, Gang
1 / 3 shared
Schubert, Markus Andreas
1 / 11 shared
Richter, Carsten
1 / 17 shared
Martinez, Irene Mediavilla
1 / 1 shared
Schwarzkopf, Jutta
3 / 7 shared
Hanke, Michael
3 / 11 shared
Uecker, Reinhard
2 / 8 shared
Braun, Dorothee
3 / 4 shared
Feldt, Christoph
1 / 1 shared
Leake, Steven John
1 / 1 shared
Von Helden, Leonard
1 / 1 shared
Chart of publication period
2024
2023
2022
2017

Co-Authors (by relevance)

  • Istrate, Cosmin
  • Tsipas, Polychronis
  • Dubourdieu, Catherine
  • Dimoulas, Athanasios
  • Hamouda, Wassim
  • Zacharaki, Christina
  • Pintilie, Lucian
  • Siannas, Nikitas
  • Kim, Dong Jik
  • Netzel, Carsten
  • Rodrigues-Weisensee, Adriana
  • Kwasniewski, Albert
  • Golz, Christian
  • Capellini, Giovanni
  • Skibitzki, Oliver
  • Persichetti, Luca
  • Spirito, Davide
  • Kang, Songdan
  • Kafi, Navid
  • Hatami, Fariba
  • Ryzhak, Diana
  • Sadofev, Sergey
  • Wang, Rongbin
  • Koch, Norbert
  • Martin, Jens
  • Serrano, Jorge
  • Mediavilla Martínez, Irene
  • Dadgostar, Shabnam
  • Kamath, Anagha
  • Jimenez, Juan
  • Niu, Gang
  • Schubert, Markus Andreas
  • Richter, Carsten
  • Martinez, Irene Mediavilla
  • Schwarzkopf, Jutta
  • Hanke, Michael
  • Uecker, Reinhard
  • Braun, Dorothee
  • Feldt, Christoph
  • Leake, Steven John
  • Von Helden, Leonard
OrganizationsLocationPeople

article

Electronic Synapses Enabled by an Epitaxial SrTiO<sub>3‐δ</sub> / Hf<sub>0.5</sub>Z<sub>r0.5</sub>O<sub>2</sub> Ferroelectric Field‐Effect Memristor Integrated on Silicon

  • Istrate, Cosmin
  • Tsipas, Polychronis
  • Dubourdieu, Catherine
  • Dimoulas, Athanasios
  • Hamouda, Wassim
  • Zacharaki, Christina
  • Schmidbauer, Martin
  • Pintilie, Lucian
  • Siannas, Nikitas
  • Kim, Dong Jik
Abstract

<jats:title>Abstract</jats:title><jats:p>Synapses play a vital role in information processing, learning, and memory formation in the brain. By emulating the behavior of biological synapses, electronic synaptic devices hold the promise of enabling high‐performance, energy‐efficient, and scalable neuromorphic computing. Ferroelectric memristive devices integrate the characteristics of both ferroelectric and memristive materials and present a far‐reaching potential as artificial synapses. Here, it is reported on a new ferroelectric device on silicon, a field‐effect memristor, consisting of an epitaxial ultrathin ferroelectric Hf<jats:sub>0.5</jats:sub>Zr<jats:sub>0.5</jats:sub>O<jats:sub>2</jats:sub> film sandwiched between an epitaxial highly doped oxide semiconductor SrTiO<jats:sub>3‐δ</jats:sub> and a top metal. Upon a low voltage of less than 2 V, the field‐effect modulation in the semiconductor enables to access multiple states. The device works in a large time domain ranging from milliseconds down to tens of nanoseconds. By gradually switching the polarization by identical pulses, the ferroelectric diode devices can dynamically adjust the synaptic strength to mimic short‐ and long‐term memory plasticity. Ionic contributions due to redox processes in the oxide semiconductor beneficially influence the device operation and retention.</jats:p>

Topics
  • impedance spectroscopy
  • semiconductor
  • laser emission spectroscopy
  • strength
  • Silicon
  • plasticity