• Tyler, Bonnie
• Rigoni, Aaron
• Divinski, Sergiy
• Voigt, Hendrik
• Rösner, Harald
• Hahn, Horst
• Wilde, Gerhard
• Chellali, Mohammed Reda
• Boltynjuk, Evgeniy

Abstract

<jats:title>Abstract</jats:title><jats:p>Comprehensive analyses of the atomic structure using advanced analytical transmission electron microscopy‐based methods combined with atom probe tomography confirm the presence of distinct glass–glass interfaces in a columnar Cu‐Zr nanoglass synthesized by magnetron sputtering. These analyses provide first‐time in‐depth characterization of sputtered film nanoglasses and indicate that glass–glass interfaces indeed present an amorphous phase with reduced mass density as compared to the neighboring amorphous regions. Moreover, dedicated analyses of the diffusion kinetics by time‐of‐flight secondary ion mass spectroscopy (ToF SIMS) prove significantly enhanced diffusivity, suggesting fast transport along the low density glass–glass interfaces. The present results further indicate that sputter deposition is a feasible technique for reliable production of nanoglasses and that some of the concepts proposed for this new class of glassy materials are applicable.</jats:p>

Topics

• Deposition
• density
• impedance spectroscopy
• amorphous
• phase
• glass
• glass
• transmission electron microscopy
• diffusivity
• selective ion monitoring
• atom probe tomography