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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Smit, Steef
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (4/4 displayed)
- 2023Puddle formation and persistent gaps across the non-mean-field breakdown of superconductivity in overdoped (Pb,Bi)2Sr2CuO6+δcitations
- 2020Tailoring Vanadium Dioxide Film Orientation Using Nanosheets: a Combined Microscopy, Diffraction, Transport, and Soft X‐Ray in Transmission Studycitations
- 2020Tailoring Vanadium Dioxide Film Orientation Using Nanosheets: a Combined Microscopy, Diffraction, Transport, and Soft X‐Ray in Transmission Studycitations
- 2020Tailoring Vanadium Dioxide Film Orientation Using Nanosheets : a Combined Microscopy, Diffraction, Transport, and Soft X-Ray in Transmission Studycitations
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article
Tailoring Vanadium Dioxide Film Orientation Using Nanosheets: a Combined Microscopy, Diffraction, Transport, and Soft X‐Ray in Transmission Study
Abstract
<jats:title>Abstract</jats:title><jats:p>Vanadium dioxide (VO<jats:sub>2</jats:sub>) is a much‐discussed material for oxide electronics and neuromorphic computing applications. Here, heteroepitaxy of VO<jats:sub>2</jats:sub> is realized on top of oxide nanosheets that cover either the amorphous silicon dioxide surfaces of Si substrates or X‐ray transparent silicon nitride membranes. The out‐of‐plane orientation of the VO<jats:sub>2</jats:sub> thin films is controlled at will between (011)<jats:sub>M1</jats:sub>/(110)<jats:sub>R</jats:sub> and (−402)<jats:sub>M1</jats:sub>/(002)<jats:sub>R</jats:sub> by coating the bulk substrates with Ti<jats:sub>0.87</jats:sub>O<jats:sub>2</jats:sub> and NbWO<jats:sub>6</jats:sub> nanosheets, respectively, prior to VO<jats:sub>2</jats:sub> growth. Temperature‐dependent X‐ray diffraction and automated crystal orientation mapping in microprobe transmission electron microscope mode (ACOM‐TEM) characterize the high phase purity, the crystallographic and orientational properties of the VO<jats:sub>2</jats:sub> films. Transport measurements and soft X‐ray absorption in transmission are used to probe the VO<jats:sub>2</jats:sub> metal–insulator transition, showing results of a quality equal to those from epitaxial films on bulk single‐crystal substrates. Successful local manipulation of two different VO<jats:sub>2</jats:sub> orientations on a single substrate is demonstrated using VO<jats:sub>2</jats:sub> grown on lithographically patterned lines of Ti<jats:sub>0.87</jats:sub>O<jats:sub>2</jats:sub> and NbWO<jats:sub>6</jats:sub> nanosheets investigated by electron backscatter diffraction. Finally, the excellent suitability of these nanosheet‐templated VO<jats:sub>2</jats:sub> films for advanced lensless imaging of the metal–insulator transition using coherent soft X‐rays is discussed.</jats:p>