Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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977 Locations available

693.932 PEOPLE
693.932 People People

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2018Tuning the Molecular Weight of the Electron Accepting Polymer in All-Polymer Solar Cells69citations
  • 2018Impact of Acceptor Fluorination on the Performance of All-Polymer Solar Cells31citations
  • 2017Unconventional Molecular Weight Dependence of Charge Transport in the High Mobility n-type Semiconducting Polymer P(NDI2OD-T2)69citations

Places of action

Chart of shared publication
Gann, Eliot
3 / 22 shared
Prasad, Shyamal K. K.
2 / 6 shared
Hodgkiss, Justin M.
2 / 8 shared
Sommer, Michael
3 / 20 shared
Deshmukh, Kedar D.
2 / 3 shared
Liu, Amelia C. Y.
2 / 10 shared
Thomsen, Lars
3 / 20 shared
Mcneill, Christopher R.
1 / 15 shared
Kabra, Dinesh
1 / 8 shared
Welford, Adam
2 / 5 shared
Connal, Luke A.
1 / 1 shared
Nahid, Masrur Morshed
1 / 1 shared
Chart of publication period
2018
2017

Co-Authors (by relevance)

  • Gann, Eliot
  • Prasad, Shyamal K. K.
  • Hodgkiss, Justin M.
  • Sommer, Michael
  • Deshmukh, Kedar D.
  • Liu, Amelia C. Y.
  • Thomsen, Lars
  • Mcneill, Christopher R.
  • Kabra, Dinesh
  • Welford, Adam
  • Connal, Luke A.
  • Nahid, Masrur Morshed
OrganizationsLocationPeople

article

Unconventional Molecular Weight Dependence of Charge Transport in the High Mobility n-type Semiconducting Polymer P(NDI2OD-T2)

  • Gann, Eliot
  • Matsidik, Rukiya
  • Sommer, Michael
  • Nahid, Masrur Morshed
  • Welford, Adam
  • Thomsen, Lars
Abstract

<p>The charge transport and microstructural properties of five different molecular weight (MW) batches of the naphthalenediimide-thiophene copolymer P(NDI2OD-T2) are investigated. In particular, the field-effect transistor (FET) performance and thin-film microstructure of samples with MW varying from M<sub>n</sub> = 10 to 41 kDa are studied. Unlike conventional semiconducting polymers such as poly(3-hexylthiophene) where FET mobility dramatically drops with decreasing molecular weight, the FET mobility of P(NDI2OD-T2)-based transistors processed from 1,2-dichlorobenzene is found to increase with decreasing MW. Using a combination of grazing-incidence wide-angle X-ray scattering, near-edge X-ray absorption fine-structure spectroscopy, atomic force microscopy, and resonant soft X-ray scattering, the increase in FET mobility with decreasing MW is attributed to the pronounced increase in the orientational correlation length (OCL) with decreasing MW. In particular, the OCL is observed to systematically increase from &lt;100 nm for the highest MW samples to ≈1 μm for the lowest MW samples. The improvement in OCL and hence mobility for low MW samples is attributed to the lack of aggregation of low MW chains in solution promoting backbone ordering, with the pre-aggregation of chains in 1,2-dichlorobenzene found to suppress longer-range liquid crystalline order.</p>

Topics
  • impedance spectroscopy
  • microstructure
  • mobility
  • atomic force microscopy
  • molecular weight
  • copolymer
  • field-effect transistor method
  • wide-angle X-ray scattering