• Sandberg, Henrik G. O.
• Torkkeli, Mika
• Serimaa, Ritva
• Bäcklund, Tomas G.
• Österbacka, Ronald
• Stubb, Henrik

Abstract

We present a new technique for orienting polymer semiconductor thinfilms. In our technique, polymer chains are rigorously oriented withoutusing any mechanical tools and with minimal risk of film contamination.The technique is based on the mechanical force resulting from thein‐plane shrinkage exerted by a shrinker (top layer) that is used toorient the semiconductor beneath an intermediate layer; the latteracting as a force mediator. The chain orientation is demonstrated byseveral techniques such as crossed‐polarizer microscopy, atomic forcemicroscopy, grazing‐incidence X‐ray diffraction, and polarizedabsorption. The orientation geometry is controlled by the shrinkingprocess and the shrinker area. The semiconductivity of the film onlystems from the transistor device structures under study, and the methodcan therefore be generalized.

Topics

• impedance spectroscopy
• polymer
• thin film
• atomic force microscopy
• semiconductor
• microscopy