| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Lockyer, Nicholas P.
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (17/17 displayed)
- 2023A high-resolution versatile focused ion implantation platform for nanoscale engineeringcitations
- 2016Evaluation of biomolecular distributions in rat brain tissues by means of ToF-SIMS using a continuous beam of Ar clusterscitations
- 2015Mass spectrometric imaging of brain tissue by time-of-flight secondary ion mass spectrometry - How do polyatomic primary beams C 60 + , Ar 2000 + , water-doped Ar 2000 + and (H 2 O) 6000 + compare?citations
- 2015Mass spectrometric imaging of brain tissue by time-of-flight secondary ion mass spectrometry – How do polyatomic primary beams C60+, Ar2000+, water-doped Ar2000+ and (H2O)6000+ compare?citations
- 2013Time-of-flight SIMS as a novel approach to unlocking the hypoxic properties of cancercitations
- 2013Peptide structural analysis using continuous Ar cluster and C60 ion beamscitations
- 2013Peptide structural analysis using continuous Ar cluster and C60 ion beamscitations
- 2013Peak picking as a pre-processing technique for imaging time of flight secondary ion mass spectrometrycitations
- 2013ToF-SIMS as a tool for metabolic profiling small biomolecules in cancer systemscitations
- 2012Peak picking as a pre-processing technique for imaging time of flight secondary ion mass spectrometry
- 2011Three-dimensional mass spectral imaging of HeLa-M cells - Sample preparation, data interpretation and visualisationcitations
- 2010Influence of omega-6 PUFA arachidonic acid and bone marrow adipocytes on metastatic spread from prostate cancercitations
- 2010Effects of cryogenic sample analysis on molecular depth profiles with TOF-secondary ion mass spectrometrycitations
- 2008Subsurface biomolecular imaging of Streptomyces coelicolor using secondary ion mass spectrometrycitations
- 2008Discrimination of prostate cancer cells and non-malignant cells using secondary ion mass spectrometrycitations
- 2008A new dynamic in mass spectral imaging of single biological cellscitations
- 2004The combined application of FTIR microspectroscopy and ToF-SIMS imaging in the study of prostate cancercitations
Places of action
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article
A high-resolution versatile focused ion implantation platform for nanoscale engineering
Abstract
The ability to spatially control and modify material properties on the nanoscale, including within nanoscale objects themselves, is a fundamental requirement for the development of advanced nanotechnologies. The development of a platform for nanoscale advanced materials engineering (P-NAME) designed to meet this demand is demonstrated. P-NAME delivers a high-resolution focused ion beam system with a coincident scanning electron microscope and secondary electron detection of single-ion implantation events. The isotopic mass-resolution capability of the P-NAME system for a wide range of ion species is demonstrated, offering access to the implantation of isotopes that are vital for nanomaterials engineering and nanofunctionalization. The performance of the isotopic mass selection is independently validated using secondary ion mass spectrometry (SIMS) for a number of species implanted into intrinsic silicon. The SIMS results are shown to be in good agreement with dynamic ion implantation simulations, demonstrating the validity of this simulation approach. The wider performance capabilities of P-NAME, including sub-10 nm ion beam imaging resolution and the ability to perform direct-write ion beam doping and nanoscale ion lithography, are also demonstrated.