Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2018Characterization of Surface and Structure of In Situ Doped Sol-Gel-Derived Silicon Carbide11citations

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Chart of shared publication
Grießer, Thomas
1 / 5 shared
Schennach, Robert
1 / 8 shared
Friedel, Bettina
1 / 3 shared
Kunert, Birgit
1 / 4 shared
Kettner, Olivia
1 / 2 shared
Chart of publication period
2018

Co-Authors (by relevance)

  • Grießer, Thomas
  • Schennach, Robert
  • Friedel, Bettina
  • Kunert, Birgit
  • Kettner, Olivia
OrganizationsLocationPeople

article

Characterization of Surface and Structure of In Situ Doped Sol-Gel-Derived Silicon Carbide

  • Šimić, Sanja
  • Grießer, Thomas
  • Schennach, Robert
  • Friedel, Bettina
  • Kunert, Birgit
  • Kettner, Olivia
Abstract

<p>Silicon carbide (SiC), is an artificial semiconductor used for high-power transistors and blue LEDs, for its extraordinary properties. SiC will be attractive for more applications, but large-scale or large-surface area fabrication, with control over defects and surface is challenging. Sol-gel based techniques are an affordable alternative toward such requirements. This report describes two types of microcrystalline SiC derived after carbothermal reduction from sol-gel-based precursors, one with nitrogen added, the other aluminum. Characterization of their bulk, structure, and surface shows that incorporation of dopants affects the formation of polytypes and surface chemistry. Nitrogen leads exclusively to cubic SiC, exhibiting a native oxide surface. Presence of aluminum instead promotes growth of hexagonal polytypes and induces self-passivation of the crystallites' surface during growth. This is established by hydrogenation of silicon bonds and formation of a protecting aluminum carbonate species. XPS provides support for the suggested mechanism. This passivation is achieved in only one step, solely by aluminum in the precursor. Hence, it is shown that growth, doping and passivation of SiC can be performed as "one-pot synthesis". Material without insulating oxide and a limited number of defects is highly valuable for applications involving surface-sensitive charge-transfer reactions, therefore the potential of this method is significant.</p>

Topics
  • impedance spectroscopy
  • surface
  • x-ray photoelectron spectroscopy
  • aluminium
  • semiconductor
  • Nitrogen
  • carbide
  • Silicon
  • defect