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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Poulsen, Henning, F.
Technical University of Denmark
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (28/28 displayed)
- 20243D microstructural and strain evolution during the early stages of tensile deformationcitations
- 2024Microstructure and stress mapping in 3D at industrially relevant degrees of plastic deformationcitations
- 2023Exploring 4D microstructural evolution in a heavily deformed ferritic alloycitations
- 2023Inferring the probability distribution over strain tensors in polycrystals from diffraction based measurementscitations
- 2022High-resolution 3D X-ray diffraction microscopy: 3D mapping of deformed metal microstructurescitations
- 2022Multiscale Exploration of Texture and Microstructure Development in Recrystallization Annealing of Heavily Deformed Ferritic Alloyscitations
- 2022Multiscale characterisation of strains in semicrystalline polymers
- 20224D microstructural evolution in a heavily deformed ferritic alloycitations
- 2020Grain boundary mobilities in polycrystalscitations
- 2019Fast and quantitative 2D and 3D orientation mapping using Raman microscopycitations
- 2018Three-dimensional grain growth in pure iron. Part I. statistics on the grain levelcitations
- 2017Determining material parameters using phase-field simulations and experimentscitations
- 2017Ultra-low-angle boundary networks within recrystallizing grainscitations
- 2015Injection molded polymeric hard X-ray lensescitations
- 2014High-Resolution Reciprocal Space Mapping for Characterizing Deformation Structurescitations
- 2012X-ray diffraction contrast tomography (DCT) system, and an X-ray diffraction contrast tomography (DCT) method
- 2011On the Use of Laguerre Tessellations for Representations of 3D Grain Structurescitations
- 2011Grain-resolved elastic strains in deformed copper measured by three-dimensional X-ray diffractioncitations
- 2011Three-Dimensional Orientation Mapping in the Transmission Electron Microscopecitations
- 2009Structured scintillators for X-ray imaging with micrometre resolutioncitations
- 2009New opportunities for 3D materials science of polycrystalline materials at the micrometre lengthscale by combined use of X-ray diffraction and X-ray imagingcitations
- 2009Measuring the elastic strain of individual grains in polycrystalline materials
- 2008A high-spatial-resolution three-dimensional detector array for 30-200 keV X-rays based on structured scintillatorscitations
- 2004Simultaneous measurement of the strain tensor of 10 individual grains embedded in an Al tensile samplecitations
- 2004Measurement of the components of plastic displacement gradients in three dimensionscitations
- 2004Metal Microstructures in Four Dimensions
- 20023DXRD microscopy - a comparison with neutron diffractioncitations
- 2000A high energy microscope for local strain measurements within bulk materials
Places of action
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article
On the Use of Laguerre Tessellations for Representations of 3D Grain Structures
Abstract
Accurate descriptions of 3D grain structures in polycrystalline materials are of key interest as the grain structure is closely correlated to the macroscopic properties of the material. In the present study, we investigate the accuracy of using Laguerre tessellations to represent 3D grain structures from only the spatial center of mass location and the volume of the grains. The ability of Laguerre tessellations to describe accurate grain shapes and topologies of real 3D grain structures are revealed by direct comparison to 3D reconstructions of an un-deformed meta-stable β -titanium alloy obtained by phase-contrast micro-tomography. This study reveals that (volume weighted) Laguerre tessellations are superior to classical Voronoi tessellations when it comes to providing accurate representations of real 3D grain structures. Furthermore, although the Laguerre tessellations were only able to correctly describe the local arrangements of grains (i.e., the grain neighbors and number of grain facets) for 31.8% of the investigated grains, the Laguerre tessellations were able to accurately describe statistical grain characteristics such as grain size distributions and grain neighbor distributions.