People | Locations | Statistics |
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Ferrari, A. |
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Schimpf, Christian |
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Dunser, M. |
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Thomas, Eric |
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Gecse, Zoltan |
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Tsrunchev, Peter |
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Della Ricca, Giuseppe |
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Cios, Grzegorz |
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Hohlmann, Marcus |
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Dudarev, A. |
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Mascagna, V. |
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Santimaria, Marco |
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Poudyal, Nabin |
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Piozzi, Antonella |
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Mørtsell, Eva Anne |
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Jin, S. |
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Noel, Cédric |
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Fino, Paolo |
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Mailley, Pascal |
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Meyer, Ernst |
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Zhang, Qi |
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Pfattner, Raphael | Brussels |
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Kooi, Bart J. |
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Babuji, Adara |
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Pauporte, Thierry |
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Guitton, Antoine
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (14/14 displayed)
- 2023Improving embrittlement in the Ti-Al-C MAX phase system: a composite approach for surface severe plastic deformationcitations
- 2023The effect of prior ultrasonic shot peening treatment on the low-temperature plasma nitriding of a metastable β-Ti alloy
- 2022Feature engineering-based approach for capturing fundamental deformation mechanisms of plasticity in β-Ti21S
- 2022Feature extraction applied to slip trace analysis in β-Ti21S
- 2022Microstructural and mechanical characterizations of Mg-based nanocomposites with MAX phases or MXenes after severe plastic deformation treatments
- 2022Experimental, mesoscopic and statistical approaches of plasticity in polycrystals ; Experimental, mesoscopic and statistical approaches of plasticity in polycrystals: Approches expérimentales, mésoscopiques et statistiques de la plasticité dans les polycristaux
- 2022Are MAX phases good candidates for doping Mg hydrogen storage?
- 2021Frank partial dislocation in Ti2AlC-MAX phase induced by matrix-Cu diffusion
- 2020Experimental study of elementary deformation mechanisms around a low-angle grain boundary in a single crystalline CrCoNi medium-entropy alloy.
- 2018Dislocation-scale characterization of the evolution of deformation microstructures on bulk materials. Case of TiAl alloys
- 2018Characterization of crystalline defects studied by STEM-in-SEM
- 2018A dislocation-scale characterization of the evolution of deformation microstructures around nanoindentation imprints in a TiAl
- 2018A dislocation-scale characterization of the evolution of deformation microstructures on a bulk TiAl alloy
- 2016Grain size determination in nanocrystalline materials using the TKD technique
Places of action
conferencepaper
Grain size determination in nanocrystalline materials using the TKD technique
Abstract
International audience ; Nanocrystalline (nc) materials, i.e. polycrystalline structures with grain sizes below 100 nm exhibit extraordinary properties strength. As a first assumption, such property derives from the short paradigm “smaller is stronger”. For grain sizes below 50 nm deformation mechanisms usually involve a quasi-stationary balance between dislocation slip and grain boundary mediated mechanisms. But there is still an ongoing debate, which one of these mechanisms governs the deformation behavior of nc metals [1,2]. Therefore determination of grain size, analysis of the local texture and characterization of grain boundaries in nanocrystalline materials are crucial. Different techniques have been tested, such as automated crystal orientation mapping in Transmission Electron Microscopes (TEM) [3]. But they suffer a lack of accuracy due to the nanocrystalline nature of tested specimen. Grain overlapping, for instance, trends to observe smaller grains. By x-ray diffraction, it is also possible to determine grain size, but measurements provide size of coherent domains only that we consider equal to grains.In this framework, a new technique based of Transmission Kikuchi Diffraction (TKD) has been been recently introduced as a SEM based method capable of giving orientation maps as the EBSD method but with a spatial resolution improved by up to one order of magnitude [4]. The technique requires a specimen thin enough to be transparent to the electron beam. In the current configuration, it uses hardware and software developed for the EBSD technique. We proposed a new configuration of the TKD where the detector is disposed horizontally on the axis of the microscope instead of being vertically positioned as in the conventional configuration (see Figure). This achieves better spatial resolution and angular resolution than the ones of the current TKD configuration [5]. Moreover, acquisition times are shorter than in the conventional technique, because the intensity of the forward scattered electrons is much ...