Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (13/13 displayed)

  • 2020Measurement of the Complex Anisotropic Permittivity of Microwave Laminates3citations
  • 2020Characterization of dielectric materials for 5G telecommunications with a Fabry-Perot open resonatorcitations
  • 2020Electrodynamic theory of ferromagnetic resonance and its applications in precise measurements of ferromagnetic linewidth, permeability tensor and saturation magnetization4citations
  • 2019W-Band Measurements of Low-Loss Dielectrics with a Fabry-Perot Open Resonator12citations
  • 2019Electrodynamic improvements to the theory of magnetostatic modes in ferrimagnetic spheres and their applications to saturation magnetization measurements14citations
  • 2019Measurement of Dielectrics from 20 to 50 GHz with a Fabry-Perot Open Resonator49citations
  • 2018Coordinate Transformation Approach to the Solution of the Fabry-Perot Open Resonator1citations
  • 2018Measurement of Electromagnetic Properties of Food Products and Liquids1citations
  • 2017Ferromagnetic Resonance Revised – Electrodynamic Approach22citations
  • 2017Modeling of Silicon-Based Substrates of Patch Antennas Operating in the Sub-THz Range12citations
  • 2016Open-ended waveguide measurement of liquids at millimeter wavelengthscitations
  • 2010Dielectric properties of chiral honeycombs – Modelling and experiment22citations
  • 2004Determination of complex permittivity with neural networks and FDTD modeling18citations

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Salski, Bartłomiej Wacław
11 / 12 shared
Krupka, Jerzy
10 / 120 shared
Karpisz, Tomasz
6 / 7 shared
Pacewicz, Adam
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Tobar, Michael E.
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Goryachev, Maxim
1 / 7 shared
Bourhill, J.
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Pavlo, Aleshkevych
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Obrębski, Dariusz
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Zagrajek, Przemysław
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Marczewski, Jacek
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Celuch, Małgorzata
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Damian, Radu
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Ciobanu, Romeo
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Eves, E. Eugene
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Co-Authors (by relevance)

  • Salski, Bartłomiej Wacław
  • Krupka, Jerzy
  • Karpisz, Tomasz
  • Pacewicz, Adam
  • Tobar, Michael E.
  • Goryachev, Maxim
  • Bourhill, J.
  • Pavlo, Aleshkevych
  • Obrębski, Dariusz
  • Zagrajek, Przemysław
  • Marczewski, Jacek
  • Celuch, Małgorzata
  • Damian, Radu
  • Ciobanu, Romeo
  • Eves, E. Eugene
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document

Characterization of dielectric materials for 5G telecommunications with a Fabry-Perot open resonator

  • Salski, Bartłomiej Wacław
  • Krupka, Jerzy
  • Kopyt, Paweł
  • Karpisz, Tomasz
Abstract

It is shown in this paper that a Fabry-Perot open resonator can be applicable to broadband characterization of low-loss dielectric materials exploited in 5G telecommunications. Although the concept of the method had been known for years, only recently a novel approach to the measurement procedure been proposed, which allows reducing measurement inaccuracy at no cost of increased computational effort. For that purpose, a new scalarone-dimensional electromagnetic model of the resonator has been proposed, the results of which are compared with measured data to evaluate, in turn, the unknown complex permittivity of a sample.Another challenge that has been solved is robust mode identification and tracking, which is essential due to the fact that the resonator is electrically long, so there are plenty of spurious modes. The whole measurement process is fully automated so that the only needed user intervention is insertion of the sample, which should be in theform of a laminate with the diameter of over 3 inches. The operation of the system is shown by measuring materials well-known in 5 G applications, such as silicon or fused silica.

Topics
  • impedance spectroscopy
  • Silicon