Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (5/5 displayed)

  • 2020Pixel-wise full-field strain measurements for analysis of strain heterogeneities with regards to the material microstructurecitations
  • 2015Crash Simulation of Wound Composite Tubes based on Multi-level Modelling5citations
  • 2011Atomic layer deposition of iridium thin films and their application in gold electrodeposition4citations
  • 2011Growth of doped silicon nanowires by pulsed laser deposition and their analysis by electron beam induced current imaging21citations
  • 2010Realization of vertical and zigzag single crystalline silicon nanowire architectures101citations

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Dubar, Mirentxu
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Bartali, A. El
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Witz, J.
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Limodin, Nathalie
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Najjar, Denis
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Duddeck, F.
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Pyttel, T.
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Zahn, D. R. T.
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Co-Authors (by relevance)

  • Dubar, Mirentxu
  • Bartali, A. El
  • Witz, J.
  • Limodin, Nathalie
  • Najjar, Denis
  • Duddeck, F.
  • Pyttel, T.
  • Schammelt, N.
  • Zahn, D. R. T.
  • Füchsel, K.
  • Kley, E.-B.
  • Szeghalmi, A.
  • Tünnermann, A.
  • Arnold, M.
  • Knez, M.
  • Michler, J.
  • Clavel, R.
  • Zhang, D.
  • Eisenhawer, B.
  • Christiansen, S.
  • Bronstrup, G.
  • Krause, M.
  • Christiansen, S. H.
  • Radnoczi, G. Z.
  • Sivakov, V. A.
  • Pecz, B.
OrganizationsLocationPeople

document

Pixel-wise full-field strain measurements for analysis of strain heterogeneities with regards to the material microstructure

  • Dubar, Mirentxu
  • Bartali, A. El
  • Witz, J.
  • Limodin, Nathalie
  • Berger, A.
  • Najjar, Denis
Abstract

A new optical-based pixel-wise full-field strain measurement method is proposed. This method allows for high spatial resolution quantification of strain heterogeneities. It is based on the production of a fine speckle pattern, the use of a large sensor camera with high magnification lens and a pixel-wise optical flow algorithm. The measured strain localizations are analyzed with regards to the microstructure of a ferritic-pearlitic steel.

Topics
  • impedance spectroscopy
  • microstructure
  • steel