• Hueting, Raymond
• Tiggelman, M. P. J.
• Reimann, K.
• Liu, J.
• Mauczok, R.
• Furukawa, Y.
• Klee, M.
• Keur, W.
• Schmitz, Jurriaan

Abstract

To analyze the intrinsic dielectric performance of planar high-density capacitors at radio frequencies (RF), the dielectric losses need to be distinguished from the resistive electrode losses. The resistive losses of the electrodes at RF are de-embedded employing a linear regression procedure with partial compensation for distributed effects. We use tunable ferroelectric capacitors with a barium strontium titanate (BST) dielectric with an inner diameter d ≥ 8 μm on a silicon substrate. The de-embedding of the electrode losses has been successfully performed utilizing 1-Port RF measurement data from of an Advantest R3767CG vector network analyzer (VNA) in the frequency range of 10 MHz – 8 GHz.

Topics

• density
• Strontium
• Silicon
• Barium