Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2024Using SPS Sintering System in Fabrication of Advanced Semiconductor Materialscitations
  • 2023In-depth analysis of the influence of bio-silica filler (Didymosphenia geminata frustules) on the properties of Mg matrix composites8citations
  • 2022Thermoelectric properties of bismuth-doped magnesium silicide obtained by the self-propagating high-temperature synthesis1citations

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Kaszyca, Kamil
2 / 5 shared
Zybała, Rafał
1 / 9 shared
Nisar, Fatima
1 / 1 shared
Błyskun, Piotr
1 / 11 shared
Rojek, Jerzy
1 / 1 shared
Chmielewski, Marcin
1 / 17 shared
Paradowski, Krystian
1 / 6 shared
Zielińska, Aleksandra
1 / 7 shared
Borucinska, Ewa
1 / 1 shared
Swieszkowski, Wojciech
1 / 15 shared
Adamczyk-Cieślak, Bogusława
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Nikiforow, Kostiantyn
1 / 7 shared
Idaszek, Joanna
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Jaroszewicz, Jakub
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Dobkowska, Anna
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Kruszewski, Mirosław
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Zybala, Rafal
2 / 4 shared
Plocinski, Tomasz
1 / 15 shared
Kurzydlowski, Krzysztof
1 / 7 shared
Zgłobicka, Izabela
1 / 4 shared
Kowiorski, Krystian
1 / 4 shared
Ciupinski, Lukasz
1 / 8 shared
Mars, Krzysztof
1 / 4 shared
Spiewak, Piotr
1 / 2 shared
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Co-Authors (by relevance)

  • Kaszyca, Kamil
  • Zybała, Rafał
  • Nisar, Fatima
  • Błyskun, Piotr
  • Rojek, Jerzy
  • Chmielewski, Marcin
  • Paradowski, Krystian
  • Zielińska, Aleksandra
  • Borucinska, Ewa
  • Swieszkowski, Wojciech
  • Adamczyk-Cieślak, Bogusława
  • Nikiforow, Kostiantyn
  • Idaszek, Joanna
  • Jaroszewicz, Jakub
  • Dobkowska, Anna
  • Kruszewski, Mirosław
  • Zybala, Rafal
  • Plocinski, Tomasz
  • Kurzydlowski, Krzysztof
  • Zgłobicka, Izabela
  • Kowiorski, Krystian
  • Ciupinski, Lukasz
  • Mars, Krzysztof
  • Spiewak, Piotr
OrganizationsLocationPeople

article

Thermoelectric properties of bismuth-doped magnesium silicide obtained by the self-propagating high-temperature synthesis

  • Kowiorski, Krystian
  • Kaszyca, Kamil
  • Kruszewski, Mirosław
  • Ciupinski, Lukasz
  • Bucholc, Bartosz
  • Zybala, Rafal
  • Mars, Krzysztof
  • Spiewak, Piotr
Abstract

Doping is one of the possible ways to significantly increase the thermoelectric properties of many different materials. It has beenconfirmed that by introducing bismuth atoms into Mg sites in the Mg2Si compound, it is possible to increase career concentration and intensifythe effect of phonon scattering, which results in remarkable enhancement in the figure of merit (ZT) value. Magnesium silicide has gainedscientists’ attention due to its nontoxicity, low density, and inexpensiveness. This paper reports on our latest attempt to employ ultrafast selfpropagatinghigh-temperature synthesis (SHS) followed by the spark plasma sintering (SPS) as a synthesis process of doped Mg2Si. Materialswith varied bismuth doping were fabricated and then thoroughly analyzed with the laser flash method (LFA), X-ray diffraction (XRD), scanning electron microscopy (SEM) with an integrated energy-dispersive spectrometer (EDS). For density measurement, the Archimedes method was used. The electrical conductivity was measured using a standard four-probe method. The Seebeck coefficient was calculated from measured Seebeck voltage in the sample subjected to a temperature gradient. The structural analyses showed the Mg2Si phase as dominant and Bi2Mg3 located at grain boundaries. Bismuth doping enhanced ZT for every dopant concentration. ZT = 0:44 and ZT=0.38 were obtained for 3wt% and 2wt% at 770 K, respectively.

Topics
  • density
  • impedance spectroscopy
  • compound
  • grain
  • phase
  • scanning electron microscopy
  • x-ray diffraction
  • Magnesium
  • Magnesium
  • Energy-dispersive X-ray spectroscopy
  • electrical conductivity
  • sintering
  • Bismuth
  • silicide