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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Rao, V. Ramgopal
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Publications (4/4 displayed)
- 2015Spin-coatable, photopatternable magnetic nanocomposite thin films for MEMS device applicationscitations
- 2015Insight into the charge transport and degradation mechanisms in organic transistors operating at elevated temperatures in aircitations
- 2015Source/drain engineering in OFETs using self assembled monolayers of metal complexed porphyrinscitations
- 2013Anisotropic strain effect on electron transport in C60 organic field effect transistorscitations
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document
Anisotropic strain effect on electron transport in C60 organic field effect transistors
Abstract
<p>Mechanical flexibility is one of the key advantages of organic semiconducting films in applications such as wearable-electronics or flexible displays. The present study is aimed at gaining deeper insight into the effect of strain on charge transport properties of the organic semiconductor films. We have fabricated high performance C<sub>60</sub> top gate organic field effect transistors (OFET) on flexible substrates and characterized the devices by curling the substrates in concave and convex manner, to apply varying values of compressive and tensile strain, respectively. Electron mobility is found to increase with compressive strain and decrease with tensile strain. The observed strain effect is found to be strongly anisotropic with respect to the direction of flow of current. This observation on mobility is quantified using an Extended Gaussian Disorder Model (EGDM) for the hopping charge transport. We suggest that the observed strain dependence of the electron transport is dominated by a change in the effective charge hopping distance over the grain boundaries in polycrystalline C<sub>60</sub> films.</p>