• Martínez, Alfredo Blázquez
• Girod, Stéphanie
• Glinsek, Sebastjan
• Aruchamy, Naveen
• Granzow, Torsten
• Grysan, Patrick
• Guennou, Mael
• Biswas, Pranab

Abstract

<jats:p>Electro-optic thin film materials, which change their refractive index upon the application of an electric field, are crucial for the fabrication of optical modulators in integrated photonic circuits. Therefore, it is key to develop strategies to tune the linear electro-optic effect. Strain engineering has arisen as a powerful tool to optimize the electro-optic coefficients in ferroelectric thin films. In this report, the electro-optical properties of polycrystalline bismuth ferrite (BiFeO<jats:sub>3</jats:sub>) thin films are studied. The electro-optic coefficients (r<jats:sub>eff</jats:sub>) of low-cost solution-processed BiFeO<jats:sub>3</jats:sub> films under different substrate-induced thermal stress are characterized using a modified Teng-Man technique in transmission geometry. The influence of poling state and substrate stress on the electro-optical properties are discussed. The films show a notable piezo-electro-optic effect: the effective electro-optic coefficient increases both under compressive and tensile in-plane stress, with compressive stress having a much more profound impact. Electro-optic coefficients of 2.2 pm/V are obtained in films under a biaxial compressive stress of 0.54 GPa.</jats:p>

Topics

• impedance spectroscopy
• thin film
• Bismuth