Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2006Copper Electroplating on Zero-Thickness ALD Platinum for Nanoscale Computer Chip Interconnects1citations
  • 2006Platinum Liner Deposited by Atomic Layer Deposition for Cu Interconnect Application4citations
  • 2003Enhancement of Copper Wetting via Surfactant-Based Post-Treatment of Ultra-Thin Atomic Layer Deposited Tantalum Nitride Linerscitations

Places of action

Chart of shared publication
Mayti, Richard
1 / 1 shared
Zhu, Yu
3 / 6 shared
Breslin, Matthew
1 / 1 shared
Miller, Christopher
1 / 2 shared
Straten, Oscar Van Der
1 / 3 shared
Chart of publication period
2006
2003

Co-Authors (by relevance)

  • Mayti, Richard
  • Zhu, Yu
  • Breslin, Matthew
  • Miller, Christopher
  • Straten, Oscar Van Der
OrganizationsLocationPeople

article

Platinum Liner Deposited by Atomic Layer Deposition for Cu Interconnect Application

  • Kaloyeros, Alain
  • Zhu, Yu
Abstract

<jats:p>Ultra-thin platinum films have a wide range of nanoscaleapplications including seed layer for electrochemicaldeposition of copper for integrated circuit interconnects.Atomic layer deposition of platinum provides a uniform andcontinuous conductive surface for subsequent Cuelectroplating. A thermal metal-organic atomic layerdeposition approach was developed for the growth of ultra-thinplatinum films by alternating pulses of(methylcyclopentadienyl)trimethylplatinum and oxygen. Theplatinum films were deposited in-situ on atomic layerdeposited tantalum nitride films. The ALD process wasoptimized by investigating growth rate saturation as afunction of individual reactant exposures as controlled by thelength of reactant pulses and the duration of the inert gaspurge cycles separating the reactant pulses. Subsequentelectrochemical deposition of Cu was demonstrated on ultra- thin Pt films.</jats:p>

Topics
  • surface
  • Oxygen
  • Platinum
  • nitride
  • copper
  • tantalum
  • atomic layer deposition