| People | Locations | Statistics |
|---|---|---|
| Naji, M. |
| |
| Motta, Antonella |
| |
| Aletan, Dirar |
| |
| Mohamed, Tarek |
| |
| Ertürk, Emre |
| |
| Taccardi, Nicola |
| |
| Kononenko, Denys |
| |
| Petrov, R. H. | Madrid |
|
| Alshaaer, Mazen | Brussels |
|
| Bih, L. |
| |
| Casati, R. |
| |
| Muller, Hermance |
| |
| Kočí, Jan | Prague |
|
| Šuljagić, Marija |
| |
| Kalteremidou, Kalliopi-Artemi | Brussels |
|
| Azam, Siraj |
| |
| Ospanova, Alyiya |
| |
| Blanpain, Bart |
| |
| Ali, M. A. |
| |
| Popa, V. |
| |
| Rančić, M. |
| |
| Ollier, Nadège |
| |
| Azevedo, Nuno Monteiro |
| |
| Landes, Michael |
| |
| Rignanese, Gian-Marco |
|
Poźniak, Krzysztof
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (18/18 displayed)
- 2019Multichannel Data Acquisition System for GEM Detectors citations
- 2018Advanced real-time data quality monitoring model for tokamak plasma diagnosticscitations
- 2017FPGA-based firmware model for extended measurement systems with data quality monitoring citations
- 2016 Modeling of serial data acquisition structure for GEM detector system in Matlabcitations
- 2016New trends in logic synthesis for both digital designing and data processing citations
- 2016The development of algorithms for the deployment of new version of GEM-detector-based acquisition systemcitations
- 2015Architecture of the Upgraded BCM1F backend Electronics for Beam Conditions and Luminosity Measurementcitations
- 2015The CMS Fast Beams Condition Monitor Back-End Electronics based on MicroTCA technology – status and development
- 2015FPGA based charge acquisition algorithm for soft X-ray diagnostics systemcitations
- 2015Development of low noise CCD readout front-end citations
- 2015OMTF firmware overviewcitations
- 2014Development of GEM Gas Detectors for X-Ray Crystal Spectrometry citations
- 2014The Fast Beam Condition Monitor BCM1F Backend Electronics Upgraded MicroTCA Based Architecturecitations
- 2013Fundamental Data Processing for GEM Detector Measurement System Applied for X - ray Diagnostics of Fusion Plasmas
- 2011Optimization of FPGA processing of GEM detector signal citations
- 2011Development of a 1D Triple GEM X-ray detector for a high-resolution x-ray diagnostics at JET
- 2005Optical network and FPGA/DSP based control system for free electon laser
- 2003Cavity Digital Control Testing System by Simulink Step Operation Method for TESLA Linear Accelerator and Free Electron Laser
Places of action
| Organizations | Location | People |
|---|
booksection
The CMS Fast Beams Condition Monitor Back-End Electronics based on MicroTCA technology – status and development
Abstract
The Fast Beams Condition Monitor (BCM1F), upgraded for LHC Run II, is used to measure the online luminosity andmachine induced background for the CMS experiment. The detector consists of 24 single-crystal CVD diamond sensorsthat are read out with a custom fast front-end chip fabricated in 130 nm CMOS technology. Since the signals from thesensors are used for real time monitoring of the LHC conditions they are processed by dedicated back-end electronics tomeasure separately rates corresponding to LHC collision products, machine induced background and residual activationexploiting different arrival times. The system is built inMicroTCA technology and uses high speed analog-to-digitalconverters.Inoperationalmodesofhighrates,consecutiveevents,spacedintimebylessthan12.5ns,maycausepartially overlapping events. Hence, novel signal processing techniques are deployed to resolve overlapping peaks. Thehigh accuracy qualification of the signals is crucial to determine the luminosity and the machine induced backgroundrates for the CMS experiment and the LHC.