| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Munk-Nielsen, Stig
Aalborg University
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (20/20 displayed)
- 2024Thermal cycling characterization of an integrated low-inductance GaN eHEMT power module
- 2024Thermal cycling characterization of an integrated low-inductance GaN eHEMT power module
- 2023Thermal Characteristics of Liquid Metal Interconnects for Power Semiconductorscitations
- 2023Thermal Characteristics of Liquid Metal Interconnects for Power Semiconductorscitations
- 2021Performance evaluation of lithium-ion batteries (LiFePO 4 cathode) from novel perspectives using a new figure of merit, temperature distribution analysis, and cell package analysiscitations
- 2021Performance evaluation of lithium-ion batteries (LiFePO4 cathode) from novel perspectives using a new figure of merit, temperature distribution analysis, and cell package analysiscitations
- 2020Parametric transformer using PM-inductors with saturation-gapcitations
- 2018Frequency domain scanning acoustic microscopy for power electronics:Physics-based feature identification and selectivitycitations
- 2018Frequency domain scanning acoustic microscopy for power electronicscitations
- 2017Short-Circuit Degradation of 10-kV 10-A SiC MOSFETcitations
- 2015Ageing monitoring in IGBT module under sinusoidal loadingcitations
- 2014A tapped-inductor buck-boost converter for a multi-DEAP generator energy harvesting systemcitations
- 2014A tapped-inductor buck-boost converter for a multi-DEAP generator energy harvesting systemcitations
- 2014A Tapped-Inductor Buck-Boost Converter for a Dielectric ElectroActive Polymer Generatorcitations
- 2014A Tapped-Inductor Buck-Boost Converter for a Dielectric ElectroActive Polymer Generatorcitations
- 2013An electromechanical model for a dielectric electroactive polymer generatorcitations
- 2013An Electromechanical Model of a Dielectric ElectroActive Polymer Generatorcitations
- 2013An Electromechanical Model of a Dielectric ElectroActive Polymer Generatorcitations
- 2012Energy Harvesting Cycles of Dielectric ElectroActive Polymer Generatorscitations
- 2012Energy Harvesting Cycles of Dielectric ElectroActive Polymer Generatorscitations
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article
Short-Circuit Degradation of 10-kV 10-A SiC MOSFET
Abstract
The short-circuit behavior of power devices is highly relevant for converter design and fault protection. In this work, the degradation during short-circuit of a 10 kV 10 A 4H-SiC MOSFET is investigated at 6 kV DC-link voltage. The study aims to present the behavior of the device during short-circuit transients as it sustains increasing short-circuit pulses during its life-time. As the short-circuit pulse length increases, degradation of the device can be observed in periodically performed characterizations. The initial degradation seems to be associated with the channel region, and continuous stressing leads to an overall increase in device on-state resistance at the end of the degradation study. Thermal simulation show that the surface aluminum metalization reached its melting temperature and the top part of the device reaches temperatures above the rated junction temperature. Scanning electron microscope (SEM) investigation shows aluminum reconstruction and cavities at the contact interface between the aluminum surface metalization and source contacts.