| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Teyssedre, Gilbert
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (13/13 displayed)
- 2023Measurement setup to simultaneously explore the location and energy of trapped charges in thin polymer filmscitations
- 2020Dielectric Properties and beta-Relaxation in Cross- linked Polyethylene: Effect of Thermal Agingcitations
- 2020Behavior of space charge in polyimide and the influence on power semiconductor device reliability
- 2018Nonlinear Regression Modeling to Predict Thermal Endurance of XLPE Material under Thermal Agingcitations
- 2018Characterization of the Electrical Behaviour of Thin Dielectric Films at Nanoscale using Methods Derived from Atomic Force Microscopy: Application to Plasma Deposited AgNPs-Based Nanocompositescitations
- 2018Analysis of Charge Accumulation Phenomena by Physicochemical Analysis for fluorinated Polymer Films Irradiated by Proton
- 2018Characterization of the electrical behaviour of thin dielectric films at nanoscale using technics methods derived from Atomic Force Microscopy : application to plasma deposited AgNPs-based nanocomposites
- 2016Space charge measurements on electron-beam irradiated LDPE films, with and without metallization of irradiated surface
- 2016The significance of electroluminescence in polyolefins
- 2014Efficient barrier for charge injection in polyethylene by silver nanoparticles/plasma polymer stackcitations
- 2014Implementation of polarization processes in a charge transport model using time and frequency domain measurements on PEN films
- 2014Tuning the plasma parameters for deposition of thin nanocomposite layer containing a monolayer of silver nanoparticles on polymer film
- 2007The grafting of luminescent side groups onto poly(vinyl chloride) and the identification of local structural features
Places of action
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conferencepaper
Characterization of the Electrical Behaviour of Thin Dielectric Films at Nanoscale using Methods Derived from Atomic Force Microscopy: Application to Plasma Deposited AgNPs-Based Nanocomposites
Abstract
Recent advances in the development of micro-and nano-devices call for applications of thin nanocomposite dielectric films (thickness less than few tens of nanometers) with tuneable electrical properties. For optimization purposes, their behaviour under electrical stress needs to be probed at relevant scale, i.e. nanoscale. To that end electrical modes derived from Atomic Force Microscopy (AFM) appear the best methods due to their nanoscale resolution and non-destructive nature which permits in-situ characterization. The potentialities of electrical modes derived from AFM are presented in this work. The samples under study consist of plasma processed thin dielectric silica layers with embedded silver nanoparticles (AgNPs). Charge injection at local scale, performed by using AFM tip, is investigated by Kelvin Probe Force Microscopy (KPFM). Modulation of the local permittivity induced by the presence of AgNPs is assessed by Electrostatic Force Microscopy (EFM).