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Nellist, Peter
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Publications (3/3 displayed)
- 2023Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditionscitations
- 2008Depth sectioning using electron energy loss spectroscopycitations
- 2008Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part II: Inelastic scatteringcitations
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Depth sectioning using electron energy loss spectroscopy
Abstract
The continued development of electron probe aberration correctors for scanning transmission electron microscopy has enabled finer electron probes, allowing atomic resolution column-by-column electron energy loss spectroscopy. Finer electron probes have also led to a decrease in the probe depth of focus, facilitating optical slicing or depth sectioning of samples. The inclusion of post specimen aberration corrected image forming lenses allows for scanning confocal electron microscopy with further improved depth resolution and selectivity.