| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Sobola, Dinara
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (24/24 displayed)
- 2024Analysis of processing efficiency, surface, and bulk chemistry, and nanomechanical properties of the Monel<sup>®</sup> alloy 400 after ultrashort pulsed laser ablationcitations
- 2024Optical Properties of Yttrium Ferrite Films Prepared by Pulse Laser Deposition
- 2024Characterization of field emission from oxidized copper emitterscitations
- 2024Optical Properties of YttriumOrthoferrite Films Prepared by PlasmaLaser Deposition
- 2024Optical and electrical performance of translucent BaTiO3-BaSnO3 ceramicscitations
- 2024Comprehensive analysis of charge carriers dynamics through the honeycomb structure of graphite thin films and polymer graphite with applications in cold field emission and scanning tunneling microscopycitations
- 2024Analysis of processing efficiency, surface, and bulk chemistry, and nanomechanical properties of the Monel® alloy 400 after ultrashort pulsed laser ablationcitations
- 2024Field Ion Microscopy of Tungsten Nano-Tips Coated with Thin Layer of the EpoxyResin
- 2023Exploring the Piezoelectric Properties of Bismuth Ferrite Thin Films Using Piezoelectric Force Microscopy: A Case Studycitations
- 2023Piezo-Enhanced Photocatalytic Activity of the Electrospun Fibrous Magnetic PVDF/BiFeO3 Membranecitations
- 2023Electrical characteristics of different concentration of silica nanoparticles embedded in epoxy resincitations
- 2022Nanoscale surface dynamics of RF-magnetron sputtered CrCoCuFeNi high entropy alloy thin filmscitations
- 2022Nanoscale surface dynamics of RF-magnetron sputtered CrCoCuFeNi high entropy alloy thin filmscitations
- 2022Characterization and Evaluation of Engineered Coating Techniques for Different Cutting Tools - Reviewcitations
- 2022Characterization and Evaluation of Engineered Coating Techniques for Different Cutting Tools-Reviewcitations
- 2022Advances in sustainable grinding of different types of the titanium biomaterials for medical applicationscitations
- 2022Multiferroic/Polymer Flexible Structures Obtained by Atomic Layer Depositioncitations
- 2022Morphotropic Phase Boundary Enhanced Photocatalysis in Sm Doped BiFeO3citations
- 2021PVDF Fibers Modification by Nitrate Salts Dopingcitations
- 2021Case Study of Polyvinylidene Fluoride Doping by Carbon Nanotubescitations
- 2021Morphological features in aluminum nitride epilayers prepared by magnetron sputtering ; Morfologické detaily v AlN epivrstvách připravených magnetronovým napařovánímcitations
- 2021Characterization of Polyvinylidene Fluoride (PVDF) Electrospun Fibers Doped by Carbon Flakescitations
- 2021Field emission properties of polymer graphite tips prepared by membrane electrochemical etchingcitations
- 2020Scanning proximal microscopy study of the thin layers of silicon carbide aluminum nitride solid solution manufactured by fast sublimation epitaxy ; Použitá sondového rastrovacího mikroskopu pro studium tenkých vrstev karbidu křemíku a nitridu hliníku vyrobených rychlou sublimační epitaxí
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article
Characterization of field emission from oxidized copper emitters
Abstract
<jats:title>Abstract</jats:title><jats:p>In this work, the field electron emission from oxidized copper emitters was studied by aging with radii in the range of 80–300 nm. The samples were prepared by an electrochemical etching method using an H3PO4 solution. The samples were exposed to air for 30 d to form an oxide film owing to aging. Measurements were carried out under high vacuum conditions in the range of 10<jats:sup>−6</jats:sup> mbar. Scanning electron microscopy-energy dispersive X-ray spectroscopy (SEM- EDS) was used to calculate the emitter radius, study the purity of the samples, and detect the oxide layers. Current–voltage (I-V) characteristics were studied and analyzed using Murphy-Goode (MG) plots and rectification tests. Furthermore, the spatial distribution of the electron emission and current stability were recorded and used to analyze the electron emission behavior of the tip surface. The trap density was also studied when the oxide layer was 3 layers thick. The results show that the emitters passed the orthodoxy test at low voltages. It was found that traps play an important role in increasing the switch-on current as the area of the oxide layer increases. It was found that the emitter acts as a point capacitor based on the charging and discharging processes of the electrons in the traps. The emission pattern showed great stability, which opens up prospects for this type of emitter in industry.</jats:p>