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Nandy, Suman
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Topics
Publications (10/10 displayed)
- 2022Smart IoT enabled interactive self-powered security tag designed with functionalized papercitations
- 2021Highly conductive grain boundaries in copper oxide thin films
- 2020Touch-Interactive Flexible Sustainable Energy Harvester and Self-Powered Smart Cardcitations
- 2020Touch-Interactive Flexible Sustainable Energy Harvester and Self-Powered Smart Cardcitations
- 2018Green Nanotechnology from Waste Carbon-Polyaniline Compositecitations
- 2018Green Nanotechnology from Waste Carbon-Polyaniline Composite ; Generation of Wavelength-Independent Multiband Photoluminescence for Sensitive Ion Detectioncitations
- 2016Photocatalytic behavior of TiO2 films synthesized by microwave irradiationcitations
- 2016Stress Induced Mechano-electrical Writing-Reading of Polymer Film Powered by Contact Electrification Mechanismcitations
- 2016Highly conductive grain boundaries in copper oxide thin filmscitations
- 2013Current transport mechanism at metal-semiconductor nanoscale interfaces based on ultrahigh density arrays of p-type NiO nano-pillarscitations
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article
Highly conductive grain boundaries in copper oxide thin films
Abstract
<p>High conductivity in the off-state and low field-effect mobility compared to bulk properties is widely observed in the p-type thin-film transistors of Cu<sub>2</sub>O, especially when processed at moderate temperature. This work presents results from in situ conductance measurements at thicknesses from sub-nm to around 250 nm with parallel X-ray photoelectron spectroscopy. An enhanced conductivity at low thickness is explained by the occurrence of Cu(II), which is segregated in the grain boundary and locally causes a conductivity similar to CuO, although the surface of the thick film has Cu<sub>2</sub>O stoichiometry. Since grains grow with an increasing film thickness, the effect of an apparent oxygen excess is most pronounced in vicinity to the substrate interface. Electrical properties of Cu<sub>2</sub>O grains are at least partially short-circuited by this effect. The study focuses on properties inherent to copper oxide, although interface effects cannot be ruled out. This non-destructive, bottom-up analysis reveals phenomena which are commonly not observable after device fabrication, but clearly dominate electrical properties of polycrystalline thin films.</p>